Method for correcting influence of thickness unevenness of recording medium, information recording/reproducing apparatus using the same method and optical head unit

ABSTRACT

An optical disk unit of this invention includes a defocus detecting system for detecting a defocus of an objective lens, a thickness unevenness detecting system for detecting a thickness unevenness of a transparent resin layer provided nearest the objective lens of a recording medium, and a thickness unevenness correcting mechanism for changing the focusing characteristic of light impinging upon the objective lens based on a change in the thickness of the transparent resin layer detected by the thickness detecting system.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of co-pending U.S. application Ser. No.11/299,674, filed Dec. 13, 2005, which is a divisional of U.S.application Ser. No. 10/095,007, filed Mar. 12, 2002, now U.S. Pat. No.7,145,846, and for which priority is claimed under 35 U.S.C. §121. Thisapplication is based upon and claims the benefit of priority under 35U.S.C. §119 from prior Japanese Patent Application No. 2001-232633,filed Jul. 31, 2001, the entire contents of all applications areincorporated herein by reference in their entireties.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to an information recording/reproducingapparatus, which is capable of, by focusing light onto a lightreflecting layer or a recording layer in an information recording mediumcomprising a transparent substrate or a transparent protective layer anda single or plural light reflecting layers or recording layers from thetransparent substrate or the transparent protective layer, reproducinginformation recorded in the light reflecting layer or the recordinglayer or recording information in the information recording medium, andfurther having a correcting mechanism capable of detecting a thicknessunevenness from light incident side for use in reproducing or recording,stretched from the surface of the transparent protective layer or thetransparent substrate to the light reflecting layer or the recordinglayer and a correcting mechanism capable of correcting an influence ofthe detected thickness unevenness, and a method for correcting thethickness unevenness employed therein, and more particularly to,

-   1) A method for correcting a thickness unevenness by the time when    information is reproduced or recording of information is started,    after an information recording medium is loaded on the information    recording/reproducing apparatus, and startup of control of that    method;-   2) A method for correcting an influence of thickness unevenness by    the time when information is reproduced or recording of the    information is started, just after a layer, which light is    converged, of the light reflecting layer or the recording layer is    moved (the layer is switched) with respect to a recording medium    having plural light reflecting layers or recording layers, and    startup of control of that method, and-   3) A method for detecting a jump between layers (irregular shift of    light converging spot between layers) generated at random, when    information is reproduced or information is recorded by converging    light to any layer in an information recording medium having plural    light reflecting layers or recording layers.

2. Description of the Related Art

Jpn. Pat. Appl. KOKAI Publication No. 2000-171346 has disclosed anexample of detecting a defocus of an objective lens by means of adefocus detecting system for detecting the defocus according to a knifeedge method, and detecting a spherical aberration or a thicknessunevenness in a substrate of a transparent recording medium with asingle photo detector 7.

In the aforementioned detecting optical system, a hologram 2 used fordividing a light converging spot including the optical axis center intotwo sections extracts half of light from the center, and separates it tolight 2 a near the optical axis center and light 2 b far from theoptical axis center. Then, a light converging spot P1 of the light 2 anear the separated optical axis center and a light converging spot P2 ofthe light 2 b far from the optical axis center are detected on divisionborder lines of split detectors 7 a-7 b and 7 c-7 d disposed at focusingpositions with respect to a photomagnetic disk 6 upon focusing.

As for the signal detection method, this publication indicates

-   i) detecting a difference in detecting signals from any one (7 a-7 b    or 7 c-7 d) of the 2-split detectors making a pair as a defocus    detecting signal,-   ii) calculating a difference in differential value of the detection    signals from the 2-split detectors (7 a-7 b and 7 c-7 d) making a    pair so as to detect a spherical aberration.

Generally, in the information recording/reproducing apparatus (opticaldisk drive unit) including the aforementioned example disclosed in theJpn. Pat. Application No. 2000-171346, the spot size D (diameter) of alight converging spot to be irradiated to the recording layer or thelight reflecting layer of the information recording medium (opticaldisk) in order to record information in the recording medium orreproduce information therefrom has such a relation of D∝λ/NA between anumerical aperture NA of the objective lens and wavelength λ of light.

Because the recording density of information to be recorded in theinformation recording medium depends upon this spot size D largely, thisspot size D needs to be reduced in order to improve the recordingdensity.

In a widely prevailing CD type disk, the NA of the objective lens issubstantially 0.47 and the wavelength of light for use is λ=780 nm.

In the DVD type disk, the NA of objective lens is substantially 0.60 andthe wavelength of light for use is λ=650 nm. Currently, it has beenproposed to obtain a recording density several times the DVD type byemploying an objective lens whose NA is about 0.9 and light ofwavelength of about λ=400 nm to meet a demand for higher density.

In the current CD type and DVD type disks, when converging light on thelight reflecting layer or the recording layer, light is irradiated fromthe side of the substrate or supporting body (beyond the substrate). Ifit is intended to converge light on the light reflecting layer or therecording layer by intensifying the NA of the objective lens andshortening the wavelength of light, light is irradiated from the side ofa covering layer (transparent protective layer) which functions as aprotective film for the light reflecting layer or the recording layerprovided opposite to the substrate (supporting body).

However, if a thickness unevenness occurs in the thickness of thetransparent protective layer, spherical aberration occurs so that lightspot converged on the light reflecting layer or the recording layer isexpanded thereby providing a problem that recording or reproductioncharacteristic deteriorates. Meanwhile, the amount of thicknessunevenness in the transparent protective layer or the amount of thespherical aberration with respect to the thickness unevenness increasesproportional to the fourth power of the NA of the objective lens.

Further, to increase the recording capacity of the information recordingmedium, it has been already proposed to provide the DVD type disk withtwo layers of the recording layers or the light reflecting layers andconverge light to only any one layer of the respective layers in thesame direction. By providing the recording layer or the light reflectinglayer with two layers each (or more), a distance from the transparentprotective layer differs depending on each layer. Thus, there isgenerated such a problem that by using an objective lens with a higherNA than 0.6 (for DVD-disk), the degree of spherical aberration generatedby the thickness unevenness exceeds its allowance largely in all thelayers or some layer exceeding its allowance may occur.

For the reason, there exists a necessity of measuring a thicknessunevenness in the transparent protective layer or a substantialthickness unevenness generated in the light reflecting layer or therecording layer so as to correct the spherical aberration in a realtime.

Meanwhile, the aforementioned Jpn. Pat. Appl. KOKAI Publication No.2000-171346 has not described anything about a correction method(control method) for removing an influence of the thickness unevennessbased on the detected spherical aberration.

Further, if there are two or more recording layers or light reflectinglayers, the light converging spot generated at random often may be movedto a different recording layer or light reflecting layer due todisturbance such as vibration (hereinafter referred to as abnormal jumpbetween the recording layers), thereby leading to difficulty of focuscontrol (generating defocus).

BRIEF SUMMARY OF THE INVENTION

An object of the present invention is to provide an informationrecording/reproducing apparatus ensuring a high reliability with respectto thickness unevenness in a transparent resin layer located between arecording layer or a light reflecting layer and an objective lens, andspherical aberration generated depending on light converging positionwith respect to a plural-layer film when light is focused on therecording layer or the light reflecting layer through an objective lensand a method of thickness unevenness correction control for removing aninfluence of the thickness unevenness.

According to an aspect of the present invention, there is provided anoptical head unit comprising:

a light source supplies light of a predetermined wavelength;

an objective lens focus the light from the light source to the recordinglayer of the recording medium;

an objective lens moving mechanism moves the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in the recording medium preliminarily;

a defocus detecting system detects a defocus in the objective lens;

a thickness unevenness detecting system detects a thickness unevennessin a transparent resin layer of the recording medium provided nearestthe objective lens; and

a thickness unevenness correcting mechanism changes a focusingcharacteristic of light impinging upon the objective lens from the lightsource based on a change in the thickness of the transparent resin layerof the recording medium detected by the thickness detecting system.

According to an other aspect of the present invention, there is providedan information recording/reproducing apparatus for reproducinginformation recorded in the recording layer or recording the informationin a recording medium, the information recording/reproducing apparatusincluding an optical head unit comprising:

a light source

an objective lens focus light from the light source to a recording layerof the recording medium;

an objective lens moving mechanism moves the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in the recording medium preliminarily;

a defocus detecting system detects a defocus in the objective lens;

a thickness unevenness detecting system for detecting a thicknessunevenness in a transparent resin layer of the recording medium providednearest the objective lens; and

a thickness unevenness correcting mechanism changes a focusingcharacteristic of the light impinging upon the objective lens from thelight source based on a change in the thickness of the transparent resinlayer of the recording medium detected by the thickness detectingsystem, wherein

the thickness unevenness of the transparent resin layer is detectedusing a defocus detecting signal detected by the defocus detectingsystem so as to remove an influence of the defocus of the objective lensby removing an influence of the thickness unevenness of the transparentresin layer.

According to a still other aspect of the present invention, there isprovided a method for removing an influence of thickness unevenness in arecording medium upon reproducing information recorded in the recordinglayer of the recording medium or recording information in the recordingmedium, including an optical head comprising: a light source forsupplying light of a predetermined wavelength; an objective lens forfocusing light from a light source to a recording layer of a recordingmedium; a defocus detecting system for detecting a defocus generatedwhen light converged to the recording medium by the objective lens isnot focused at a predetermined position; a thickness unevennessdetecting system including at least two photo detecting regions and fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest the objective lens;a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon the objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by the defocus detecting system, the method comprising:

when changing the recording layer which light is focused by theobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by the objective lens.

Additional objects and advantages of the invention will be set forth inthe description which follows, and in part will be obvious from thedescription, or may be learned by practice of the invention. The objectsand advantages of the invention may be realized and obtained by means ofthe instrumentalities and combinations particularly pointed outhereinafter.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING

The accompanying drawings, which are incorporated in and constitute apart of the specification, illustrate embodiments of the invention, andtogether with the general description given above and the detaileddescription of the embodiments given below, serve to explain theprinciples of the invention.

FIG. 1 is a schematic view for explaining an example of the basicstructure of an optical head unit and an informationrecording/reproducing apparatus incorporating the optical head unit ofthe present invention;

FIG. 2 is a schematic view for explaining an example of the structure inmore detail, of the optical head unit and the informationrecording/reproducing apparatus incorporating the optical head unitshown in FIG. 1;

FIG. 3 is a schematic view for explaining occurrence of a shift of acircle of least confusion due to spherical aberration, which is aphenomenon generated when the thickness of a transparent protectivelayer near an objective lens changes while a laser beam converges on arecording layer near a covering layer of an optical disk (informationrecording medium) in an optical disk unit;

FIG. 4 is a schematic view for explaining changes in light intensity oflight spots of the laser beam at respective positions corresponding toshift positions of the circle of confusion, when a converging positionor the minimum circle of confusion by a spherical lens in a directionalong an optical axis of a detecting optical system shifts in theoptical disk unit shown in FIG. 2;

FIG. 5 is a schematic view for explaining a shift amount along theoptical axis of ±first-order light generated by a hologram device fordefining an optimum range of a distance between A and O and a distancebetween B and O shown in FIG. 4, and detection characteristic thereof;

FIG. 6 is a graph showing a calculation result based on an expression(5);

FIGS. 7A and 7B are schematic views for explaining a principle thatdetection sensitivity can be improved by an increase of the occurrenceof the spherical aberration described with reference to FIG. 3;

FIG. 8 is a schematic view for explaining a principle capable ofproviding a shift amount along the optical axis of ±first-order lightgenerated by a hologram device for defining an optimum range of adistance between A and O and a distance between B and O shown in FIG. 4,and detection characteristic thereof;

FIG. 9 is a graph showing changes in a value Q when c and σ calculatedaccording to equations (10-23) to (10-25) change;

FIG. 10 is a graph for comparing the frequency characteristics (transferfunctions) of a defocus correction control circuit and a thicknessunevenness correction control circuit;

FIGS. 11A to 11F are schematic views for explaining the characteristicof a defocus detecting signal and the characteristic of a thicknessunevenness detecting signal in the optical disk unit 10 (optical headunit and information recording/reproducing apparatus using the sameoptical head unit shown in FIG. 1) shown in FIG. 2;

FIG. 12 is a schematic view for explaining another embodiment of theoptical disk unit shown in FIG. 2;

FIG. 13 is a schematic sectional view for explaining still anotherembodiment of the optical disk unit shown in FIG. 2;

FIG. 14 is a schematic sectional view for explaining a furtherembodiment of the optical disk unit shown in FIG. 2;

FIG. 15 is a schematic sectional view for explaining a still furtherembodiment of the optical disk unit shown in FIG. 2;

FIG. 16 is a schematic sectional view for explaining a yet still furtherembodiment of the optical disk unit shown in FIG. 2;

FIGS. 17A to 17G show a relative position of defocus and changes in theoutput of the thickness unevenness detecting signal and thicknessunevenness detecting sum signal;

FIGS. 18A and 18B show an example of a method for extracting a starttiming of thickness unevenness detection/correction control by detectinga status having a small thickness unevenness amount using the sum signalof the thickness unevenness detecting signal as an applied example otherthan detection of abnormal jump between converging spot recordinglayers;

FIGS. 19A and 19B show a processing method for recording informationacross plural recording layers 3 b and 3 d from a side of theinformation recording medium 3 and for reproducing the same information,which is a modification of the method for extracting a start timing ofthickness unevenness detection/correction control by detecting a statushaving a small thickness unevenness amount using the sum signal of thethickness unevenness detecting signal described with reference to FIGS.18A and 18B; and

FIG. 20 is a schematic diagram (flow chart) for explaining a process fordetecting a jump (an undesired shift of converging light between layers)between the recording layers on which the converging light is focused.

DETAILED DESCRIPTION OF THE INVENTION

Hereinafter, the embodiments of the present invention will be describedin detail with reference to the accompanying drawings.

FIG. 1 is a schematic view for explaining an example of the basicstructure of an optical head unit and an informationrecording/reproducing apparatus incorporating the optical head unit ofthe present invention.

As shown in FIG. 1, each of the optical head unit and the informationrecording/reproducing apparatus 1 incorporating the optical head unitincludes a laser device 2 for emitting a laser beam of a predeterminedwavelength, an objective lens 4 for focusing the laser beam emitted fromthe laser device 2 on an information recording medium or an arbitraryrecording layer in an optical disk 3 capable of achieving a high densityrecording, in which two layers are provided on a single side thereof,and defocus correcting coils 5 for changing the position of theobjective lens 4 so that a distance between an arbitrary recording layerof the optical disk 3 and the objective lens 4 matches a focal distanceinherent of the objective lens 4.

A thickness unevenness (spherical aberration) correcting mechanism 101for correcting the unevenness (spherical aberration) in thickness of asurface covering layer 3 a provided on the side on which the laser beamincidence side of the optical disk 3 is provided between the laserdevice 2 and the objective lens 4.

A defocus detecting system 102 is provided between the optical disk 3and the laser device 2. The defocus detecting system 102 detects adefocus, which is a deviation of the position of the objective lens 4according to the laser beam directed from the laser device 2 to theoptical disk 3 and a reflect laser beam which is reflected by anarbitrary recording plane of the optical disk 3 and split by a beamsplitter 6 for splitting the laser beam reflected by the recording layerof the optical disk 3. The thickness unevenness correcting mechanism 101brings the status of the laser beam incidence upon the objective lens 4near a status having no thickness unevenness, based on a thicknessunevenness component detected by a thickness unevenness (sphericalaberration) detecting system 103, which picks up the thicknessunevenness (spherical aberration) of the covering layer 3 a in theoptical disk 3, included in the defocus component detected by thedefocus detecting system 102. Meanwhile, the position of the objectivelens 4 is controlled independently by a defocus correcting circuit 105corresponding to the defocus detected by the defocus detecting system102.

According to the principle of thickness unevenness detection (sphericalaberration detection), as shown in FIG. 1, a thickness unevennessdetection (spherical aberration detection) signal is obtained only whenthe defocus correction is carried out completely (on focusing). Thisindicates a necessity of detecting the defocus at a very high precision.To meet that demand, the defocus is detected using all spot sections ofa laser beam (if knife edge method is employed to detect the defocus,the defocus detection is carried out using half of detected lightextracted by splitting along a straight line including the vicinity ofan optical axis in which the detection accuracy is stabilized most). Asa result, even if the laser beam contains much spherical aberration, thedefocus can be detected very stably at a high precision.

FIG. 2 is a schematic view for explaining an example of the structure inmore detail, of the optical head unit and the informationrecording/reproducing apparatus (hereinafter referred to as optical diskunit) incorporating the optical head unit shown in FIG. 1.

As shown in FIG. 2, an optical disk unit 10 records information in anarbitrary recording layer of the optical disk 3, which is an informationrecording medium, and reproduces information from the optical disk 3.More specifically, in the optical disk unit 10, a laser beam 12 isirradiated from a laser unit 11, which is a light source, to apredetermined recording layer 3 d or 3 b in the optical disk 3 and areflect laser beam 12′ reflected from the arbitrary informationrecording layer 3 d or 3 b in the optical disk 3 is received so as toreproduce information recorded in the optical disk 3. When informationis recorded in the optical disk 3, an intensity of the laser beamemitted from the laser device 2 changes intermittently by changing themagnitude of a laser driving current supplied to the laser unit 11corresponding to data to be recorded (information) is irradiated to anarbitrary information recording layer of the optical disk 3. Meanwhile,recording of information into the optical disk 3 and reproduction ofinformation from the optical disk 3 will be described in detail later.Although not shown, needless to say, a guide groove acting as a guidewhen information is recorded and a signal mark string, which is alreadyrecorded information, are formed in the information recording layers 3 dand 3 b of the optical disk 3.

In the optical disk unit 10 shown in FIG. 2, laser beam 12 emitted fromthe laser unit 11 is collimated by a collimate lens 13, irradiated intoa polarization beam splitter 14 and passes through it toward the opticaldisk 3. The laser beam 12 passing through the polarization beam splitter14 passes a λ/4 plate 15, a thickness unevenness correcting concave lens16 and a thickness unevenness correcting convex lens 17 successively andthen is guided to an objective lens 19. Meanwhile, the thicknessunevenness correcting convex lens 17 is formed so as to be movable inthe direction of the optical axis by means of a thickness unevennesscorrecting convex lens driving coil 18. The objective lens 19 is formedso as to be movable independently in the optical axis direction and ineach of directions perpendicular to a track (guide groove) and thesignal mark string (not shown) formed in the optical disk 3.

The laser beam 12 guided by the objective lens 19 is provided withpredetermined convergence so that it is converged to a predeterminedrecording layer of the optical disk 3. In the optical disk (informationrecording medium) 3, a recording layer or an optical reflecting layer 3d is provided on one face of a substrate 3 e such that it adjoins thesubstrate 3 e (adjacent the substrate), followed by a space layer 3 ctransparent to the wavelength of the laser beam 12, a recording layer oran optical reflecting layer 3 b (adjacent a covering layer) apart fromthe recording layer or the optical reflecting layer adjacent thesubstrate 3 e and a transparent protective layer (light irradiation sidecovering layer) 3 a, layered successively.

The laser beam 12 focused on any one of an arbitrary recording layers(or light reflecting layers) 3 d and 3 b in the optical disk 3 by theobjective lens 19 forms a recording mark (pit) in that light focusedrecording layer by changing the characteristic of the phase of therecording layer while reflected laser beam 12′ generated slightly isreturned to the objective lens 19. On the other hand, when informationis reproduced, light intensity is changed depending on the status of therecording layer and reproduced laser beam (reflected laser beam) 12′ isreturned to the objective lens 19. Because the reproduced laser beam 12′and the reflected laser beam 12′ are handled substantially in the samemanner in a signal reproducing system described below, hereinafter, thereproduced laser beam 12′ will be described below.

The reproduced laser beam 12′ returned to the objective lens 19 passesthe thickness unevenness correcting convex lens 17, the thicknessunevenness correcting concave lens 16 and the λ/4 plate 15 to be sentback to the polarization beam splitter 14. The polarization beamsplitter 14 separates the reflected laser beam 12′ from laser beam 12directed from the laser unit 11 toward the objective lens 19 (opticaldisk 3).

The reproduced laser beam 12′ separated from the laser beam 12 by thepolarization beam splitter 14 is divided to substantially ½ each by ahalf prism 22.

After the separation, one laser beam 12′ is provided with predeterminedconvergence by a spherical lens 23 and then provided with predeterminedfocusing characteristic in a direction perpendicular to the optical axis(section of the laser beam 12′) by cylindrical lens 24 provided afterthe lens 23 so that it is focused on a light receiving plane of a firstphoto detector 25 for use in detecting a defocus and track shift.Meanwhile, the first photo detector 25 is a four-division photo detectorhaving four light receiving regions 25 a, 25 b, 25 c and 25 d, producedby dividing with two straight lines passing the optical axis andperpendicular to each other. For explanation of a light receivingpattern, FIG. 2 shows a plan view of the condition in which theseparated reproduced laser beam 12′ is focused.

Remaining separated reproduced laser beam 12′ passes a hologram device26 in which a predetermined refraction pattern is formed and asensitizing filter 27 for facilitating detection of a sphericalaberration in order. After being provided with predetermined convergenceby a spherical lens 28, the beam is focused on a light receiving planeof a second photo detector 29. The second photo detector 29 is adetector in which three light receiving regions 29 a, 29 b and 29 c aredisposed in series so that zero-order light and ±first-order lightpassing the hologram device 26 can be received in an arbitrary directionperpendicular to the optical axis. For explanation of the pattern of thelight receiving plane, FIG. 2 shows a plan view of the condition inwhich the separated reproduced laser beam 12′ is focused. An opticalsystem having the spherical lens 23, the cylindrical lens 24 and thefirst photo detector 25 corresponds to the defocus detecting system 102in FIG. 1 while an optical system having the hologram device 26, thesensitizing filter 27 for detecting spherical aberration, the sphericallens 28 and the second photo detector 29 corresponds to the thicknessunevenness (spherical aberration) detecting system 103 shown in FIG. 1.

An optical system including the thickness unevenness correcting concavelens 16, the thickness unevenness correcting convex lens 17 and thethickness unevenness correcting convex lens driving coil 18 correspondsto the thickness unevenness (spherical aberration) correcting mechanism101. A current of a predetermined magnitude and polarity is suppliedfrom a spherical aberration correcting circuit 104 shown in FIG. 1 tothe thickness unevenness correcting convex lens driving coil 18 andconsequently, the thickness unevenness correcting convex lens 17 ismoved so as to change a distance between the thickness unevennesscorrecting convex lens 17 and the thickness unevenness correctingconcave lens 16, thereby making it possible to correct an influence ofthe spherical aberration (unevenness of the thickness of the coveringlayer 3 a in the optical disk 3).

The reproduced laser beam 12′ focused on the first photo detector (fordetecting a defocus and a track shift) 25 is converted to electricsignal (current) corresponding to the light intensity of irradiatedlaser beam 12′ by the four light receiving regions 25 a, 25 b, 25 c and25 d and then converted to a voltage value by preamplifiers 41(corresponding to the light receiving region 25 a), 42 (corresponding tothe light receiving region 25 b), 43 (corresponding to the lightreceiving region 25 c) and 44 (corresponding to the light receivingregion 25 d).

Outputs of the respective preamplifiers 41 to 44 are inputted to anadder 71 for summing an output of the preamplifier 41 with an output ofthe preamplifier 43, an adder 72 for adding an output of thepreamplifier 42 with an output of the preamplifier 44, an adder 73 forsumming an output of the preamplifier 42 with an output of thepreamplifier 43 and an adder 74 for summing an output of thepreamplifier 41 with an output of the preamplifier 44.

The outputs of the adders 71 and 72 are subtracted by a subtractor 81 inorder to generate a defocus control signal to be supplied to the defocuscorrecting coil 20 for use in correcting a defocus of the objective lens19 and amplified (seldom attenuated) to a predetermined level by again/band setting circuit 82. After the phase is compensated by a phasecompensating circuit 83, the signal is outputted to an adder 85 at apredetermined timing by a switch 84.

A signal supplied to the adder 85 (after the gain and band are set upand the phase is compensated ) is added to a reference voltage suppliedfrom a reference voltage generating section 86 and amplified to apredetermined magnitude by an amplifier 87 and supplied to the focuscoil 20 at a timing set up by the switch 84.

The outputs of the adders 73 and 74 are subtracted by a subtractor 75 inorder to generate the track shift control signal to be supplied to atrack shift correcting coil 21 for correcting the track shift of theobjective lens 19 and amplified (seldom attenuated) to a predeterminedlevel by a gain/band setting circuit 76. After the phase is compensatedby a phase compensating circuit 77, the signal is amplified to apredetermined magnitude by an amplifier 78 and then supplied to thetrack coil 21.

The outputs of the adders 73 and 74 are summed up by an adder 91 inorder to obtain a reproduction signal and a result thereof is suppliedto a reproduction signal processing circuit 92.

The reproduced laser beam 12′ focused on the second photo detector (fordetecting spherical aberration (thickness unevenness of the coveringlayer) 29 is converted to an electric signal (current) corresponding tothe light intensity of irradiated laser beam 12′ by the light receivingregion 29 a for receiving the zero-order light and the light receivingregions 29 b and 29 c for receiving the +first-order lights and thenconverted to a voltage value by preamplifiers 31 (corresponding toregion 29 b), 32 (corresponding to region 29 a), and 33 (correspondingto region 29 c).

The outputs of the preamplifiers 31 and 33 are supplied to a subtractor50 and an adder 51 for carrying out addition so as to generate adifference signal and a sum signal between voltages signals obtainedfrom the +first-order light.

The difference signal obtained by the subtractor 50 is amplified (insome rare cases attenuated) to a predetermined gain by a gain/bandsetting circuit 52 and after that, a predetermined band is set up. Afterthe phase is compensated by a phase compensating circuit 53, the signalis outputted to an adder 55 at a predetermined timing by a switch 54.

The difference signal supplied to the adder 55 (after the gain and bandare set up and the phase is compensated) is added to a reference signalsupplied from a reference voltage generating section 56 and amplified toa predetermined magnitude by an amplifier 57. After that, the signal issupplied to the thickness unevenness correcting convex lens driving coil18 at a timing set up by the switch 54.

The sum signal obtained by the adder 51 is compared with a signalobtained in a comparator 59 by converting photo-electrically thezero-order light produced by attenuating the output of the preamplifier32 to a predetermined level by means of an attenuator 58 in order toenable comparison with that sum signal, because the sum signal has anintensity base on the ±first-order light. The output of the comparator59 is employed as a detection signal for detecting abnormal jump betweenrecording layers (described later) 60.

A phenomenon generated when the thickness of the surface covering layer3 a with the laser beam 12 focused on the recording layer 3 b (near thecovering layer) in the optical disk (information recording medium) 3will be described with reference to FIG. 3.

The objective lens 19 is designed so as to collect light most (theminimum circle of confusion coincides with the depth of the coveringlayer) when the thickness of the transparent protective layer (coveringlayer) 3 a is of an ideal thickness).

For example, if the thickness of the surface covering layer 3 a isthinner than ideally expected, the spherical aberration occurs so that alaser beam 12 passing outside of the objective lens 19 is focusedfrontward of a laser beam 12 passing inside of the objective lens 19 inthe optical axis direction. Therefore, a position in which the lightintensity (center intensity) in a spot section of the laser beam 12maximizes at the position of the minimum circle of confusion (in theoptical axis direction) is moved frontward by δ as compared to whenthere is no spherical aberration.

Conversely, if the thickness of the surface covering layer 3 a isthicker than ideally expected, the position of the minimum circle ofconfusion is moved in an opposite direction to the example shown in FIG.3 or deeper in the optical axis direction (rightward in thisspecification) although not shown.

When the objective lens 19 is moved a space between the recording layer3 d (near the substrate) and the layer 3 b (near the covering layer) ofthe objective lens 19 as well as when the thickness of the surfacecovering layer 3 a changes, the position of the objective lens 19 iscorrected so that the spherical aberration becomes 0 while beam isfocused on the recording layer 3 b (near the covering layer) and then,if a spot of the laser beam 12 is moved to the recording layer 3 d (nearthe substrate), the same phenomenon occurs.

If the change rate of the thickness of the surface covering layer 3 a isrelatively smaller than ideally expected, the change rate of thethickness and the moving distance δ shown in FIG. 3 can be regarded tobe in an approximately proportional relation.

As shown in FIG. 2, according to the present invention, all thereproduced laser beam 12′ is received by the first photo detector 25 andused for detection of the defocus, even if a great deal of sphericalaberration components are contained in the reproduced laser beam 12′,the defocus can be detected stably at a high precision.

Because a position where refracted light in the direction of the opticalaxis of the reproduced laser beam 12′ is focused using the hologramdevice 26 is shifted by a predetermined amount as shown in FIG. 2, thereproduced laser beam 12′ passing the spherical lens 28 and providedwith predetermined convergence is converged by an activity of thehologram device 26 such that refracted light of the +first-order lightis focused backward of the light receiving plane of the second photodetector 29 while the −first-order refracted light is focused frontwardof the light receiving plane of the second photo detector 29. In otherwords, the second photo detector 29 is disposed at a position where thezero-order light of the reproduced laser beam 12′ passing the hologramdevice 26 is converged and a contrast position to the position where the±first-order lights generated by the hologram device 26 are focused inthe direction of the optical axis.

Consequently, the zero-order light of the reproduced laser beam 12′focused by the second photo detector 29 is focused at a predeterminedposition of the second photo detector 29 as a small convergent spot 12 awhile the +first-order light and −first-order light are focused at eachpredetermined position thereof as larger spots 12 b and 12 c than thespot 12 a.

As shown in FIG. 2, the amount of light of each the zero-order beam spot12 a and the +first-order beam spots 12 b and 12 c is detected by thephoto detecting cells 29 a, 29 b and 29 c within the second photodetector 29. The photo detecting cells 29 b and 29 c for detecting the±first-order beam spots 12 b and 12 c, can detect only the centerportion of the beam spots 12 b and 12 c so as to detect the lightintensity in the center of each of the beam spots 12 b and 12 c.Meanwhile, a direction in which the track direction (circumferentialdirection) of the information recording medium 3 is irradiated to thesecond photo detector 29 is a vertical direction relative to thisspecification paper in FIG. 2. By intersecting the length direction ofeach of the photo detecting cells 29 b and 29 c with the trackdirection, the light is unlikely to be affected by the refractionpattern contained in light reflected by a pre-groove (not shown) on theinformation recording medium 3.

More specifically, according to the method for detecting the sphericalaberration, the center intensities of the ±first-order beam spots 12 band 12 c, which are parts of the laser beams 12 separated by thehologram device 26, or distributions of brightness of the beam spots 12b and 12 c or at least a spot size of the beam spots 12 b and 12 c iscompared about two different positions (points A and B in FIG. 4described later) in the direction of the optical axis of the laser beam12. That is, by comparing about any one of the center intensities,brightness distributions or spot sizes of the ±first-order beam spots 12b and 12 c, the magnitude (quantity) and direction of sphericalaberration originated from the thickness unevenness of the surfaceprotective layer (covering layer) 3 a are detected.

FIG. 4 is a schematic view for explaining changes in light intensity oflight spots of the laser beam 12 at respective positions correspondingto shift positions of the minimum circle of confusion, when a convergingposition or the minimum circle of confusion by a spherical lens 28 in adirection along optical axis of a detecting optical system shifts.

In FIG. 4, the position “O” indicates a position of a zero-order photodetecting cell 29 a in the second photo detector 29 relative tozero-order light having no spherical aberration, the position “A”indicates a position of a photo detecting cell 29 b relative to the+first-order light beam and the position “B” indicates a position of aphoto detecting cell 29 c relative to the −first-order light beam.

Although as evident from FIG. 4, the center intensities of the+first-order light beams at the positions “A” and “B” coincide with eachother in a condition having no spherical aberration or on a curve α, ifa slight spherical aberration occurs as indicated on a curve β, thecenter intensity at the position “B” is stronger than the centerintensity at the position “A”. A difference between these centerintensities is obtained with the subtractor 50.

If such a large change as a shift of the spot of the laser beam 12 tothe recording layer 3 d occurs due to a disturbance or the like when thefocal point of the spherical lens 28 is matched with the recording layer3 b near the covering layer (if an abnormal jump between the recordinglayers occurs), the magnitude of the spherical aberration is increasedlargely as indicated by a curve γ. As a result, the amounts of detectedlights drop conspicuously both at the positions “A” and “B”.

That is, because the total amount of lights detected at the photodetecting cells 29 b and 29 c in the second photo detector 29 dropsremarkably when an abnormal jump between recording layers occurs, outputsignal of the adder 51 shown in FIG. 2 drops largely. On the other hand,because drop of the light amount of the laser beam 12 a irradiated bythe photo detecting cell 29 a is slight even if the abnormal jumpbetween the recording layers occurs, the output signal of the attenuator58 does not change so much. Thus, by detecting a difference between theboth with the comparator 59, a detection signal 60 of detecting anabnormal jump between the recording layers 3 d and 3 b can be obtained.

Next, optimum ranges of moving amounts (a distance between A and O and adistance between B and O in FIG. 4) in a direction along the opticalaxis of the +first-order light beams generated with the hologram device26 will be described.

First, a consideration model for use in considering a detectioncharacteristic will be described with reference to FIG. 5.

The laser beam 12 emitted from the laser unit 11 described withreference to FIG. 2 passes the collimate lens 13 and the objective lens19 as shown on the left of FIG. 5 and are focused on the recording layer3 b near the covering layer of the optical disk 3 and the recordinglayer 3 d near the substrate.

On the other hand, the reproduced laser beam 12′ reflected by therecording layer 3 b near the covering layer of the optical disk and therecording layer 3 d near the substrate passes the objective lens 19 andthe spherical lens 28 successively as shown on the right side of FIG. 5so as to be provided with predetermined focusing characteristic and areirradiated onto the second photo detector 29.

Assuming that the lateral magnification of the detecting system is M, ifoptical paths of laser beams are parallel between the objective lens 19acting upon the laser beam 12 directed to the recording layer and thespherical lens 28 acting upon the reflected laser beam 12′, the lateralmagnification is given as a ratio between the focal distance of thespherical lens 28 and the focal distance of the objective lens 19. Depthmagnification is given as M² in the same optical system.

If a thickness unevenness δ t is generated in the transparent protectivelayer 3 a as described previously with reference to FIG. 3, the positionof the minimum circle of confusion of the laser beam 12 focused on therecording layers 3 b and 3 d of the optical disk 3 by the objective lens19 shifts by only δ However, after reflected by the recording layer 3 bor 3 d, the laser beam 12 returned to the objective lens 19 is affectedby the thickness unevenness δ t of the transparent protective layer 3 aagain. A shift amount ζ of the minimum circle of confusion of the laserbeam 12′ focused on the second photo detector 29 is expressed bymultiplying double a distance between the objective lens 19 and therecording layer of the optical disk 3 (reciprocation distance) with thedepth magnification.ζ=4M²δ  (1)

Assuming that a factor which changes the position of the minimum circleof confusion by only δ is ω, a numerical aperture number of theobjective lens 19 is NA, refractive index of the transparent protectivelayer 3 a is n and the amount of defocus is δ z, if when a defocushaving a magnitude of δ z occurs, a defocus due to wave aberration isω₂₀ and a defocus due to a thickness unevenness of the substrateprotective layer 3 a (that is, it is reasonable that this is originatedfrom spherical aberration) is ω₄₀, the factor is ω=ω₂₀+ω₄₀. The ω₂₀ andω₄₀ can be expressed in the same way as an expressions (A.1) and (A.2)described in H. Ando et. al. : Jpn J. Appl. Phys. Vol. 32 (1993) Pt. 1,No. 11B p. 5272. $\begin{matrix}{{\omega_{20} = {\frac{1}{2}{NA}^{2}\delta\quad z}}{and}} & (2) \\{\omega_{40} = {\frac{n^{2} - 1}{8n^{3}}{NA}^{4}\delta\quad t}} & (3)\end{matrix}$

If the δ z in the expression (2) is substituted for δ in (1), the shiftamount ξ of the minimum circle of confusion of the laser beam 12′focused by the second photo detector 29 is expressed as $\begin{matrix}{\zeta = {8{\omega_{20}\left( \frac{M}{NA} \right)}^{2}}} & (4)\end{matrix}$

A change in the spot center intensity of the laser beam 12 relative to aspherical aberration coefficient ω₂₀ corresponding to the defocus amountδ z when the wavelength of the laser beam 12 is assumed to be λ, isexpressed with following expressions obtained by substituting 0 for η inan expression (10) (here, expressed as an expression (M10) and theexpression (M10) is marked at an end of the expression), described inthe above quoted H. Ando et. al. : Jpn J. Appl. Phys. Vol. 32 (1993) Pt.1, No. 11B p. 5272. $\begin{matrix}{{{I\left( \omega_{20} \right)} \approx \frac{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}^{2} + {4\quad{{\exp\left( {- \sigma^{2}} \right)} \cdot {\sin^{2}\left( \frac{k\quad\omega_{20}}{2} \right)}}}}{\sigma^{4} + \left( {k\quad\omega_{20}} \right)^{2}}}{and}} & (5) \\{k = {2\quad\frac{\pi}{\lambda}}} & (6)\end{matrix}$

When assuming that distribution of intensity in section of the laserbeam 12 impinging upon the objective lens 19 in light transmittingsystem located on the left (on this paper) relative to the recordingmedium 3 in FIG. 5 is Gauss distribution, a region of a radius e⁻² fromthe center is regarded to be an effective beam diameter of the laserbeam 12 or a diameter (W) of a beam spot, σ means a value A/W which is aratio relative to the diameter of the objective lens 19 (here, effectiveaperture diameter (A)) (σ=A/W).

FIG. 6 shows a calculation result of the expression (5). As evident fromFIG. 6, a region in which the change of the center intensity relative toaberration ω₂₀ corresponding to a defocus amount δ z is a range from 0.2to 0.8 in vertical axis (a relative center intensity under a conditionin which the maximum is normalized to “1”).

A defocus amount ω₂₀ corresponding to a defocus amount δ z in which thecenter intensity is 0.2 is ±0.65λ on the horizontal axis (axis of “λ”times the wavelength of the laser beam 12) when σ=0 and ±0.65λ whenσ=0.8. On the other hand, the defocus amount ω₂₀ corresponding to thedefocus amount δ z in which the center intensity is 0.8 is ±0.26λ whenσ=0 and σ=0.8.

Therefore, if the expression (4) is used, an optimum range of a distancefrom a focal point of the laser beam 12 by the objective lens 19 to thesecond photo detector 29 (a distance between A and O and a distancebetween B and O in FIG. 4) is given in the form of $\begin{matrix}{{\zeta \leqq {5.2\quad{\lambda\left( \frac{M}{NA} \right)}^{2}}}{and}} & (7) \\{\zeta \geqq {2.1{\lambda\left( \frac{M}{NA} \right)}^{2}}} & (8)\end{matrix}$

As described above, the principle of detecting a thickness unevenness(detecting a spherical aberration) of the transparent protective layer 3a according to the present invention has a feature that a defocusdetecting optical system (a portion comprised of the spherical lens 23,a cylindrical lens 24 and the first photo detector 25 in FIG. 1) isprepared separately from a detecting optical system for detecting athickness unevenness of the transparent protective layer 3 a and outputoriginated from the thickness unevenness is corrected using a detectingsignal of the thickness unevenness detecting system (sphericalaberration detecting system) in a condition that the defocus correctingcontrol is carried out (when focusing is attained).

Next, the structure of the sensitizing filter for detecting thespherical aberration shown in FIG. 2 and sensitizing principle will bedescribed.

The sensitizing filter 27 for detecting the spherical aberrationintensifies actual sensitivity upon detecting the spherical aberrationby dividing a section of the reproduced laser beam 12′ to at least twosections [dividing a region along an optical path section is generallycalled “wavefront splitting”] and changing any one or both of i)transmission light amount or ii) phase characteristic with respect topart of light subjected to the wavefront splitting. Intensifying thespherical aberration detection characteristic using the sensitizingfilter 27 means a different content of the invention (specific featureof the present invention) independent from the content of the inventiondescribed up to here.

Hereinafter, the sensitizing principle will be described in detail.

As described previously with reference to FIG. 3, if the sphericalaberration occurs, in the section spot of the reproduced laser beam 12′returned to the objective lens 19, a component passing outside acomponent in the optical axis center (region of a predetermined radiusincluding the optical axis) is converged forward of a component passinginside or the region including the optical axis (FIG. 7A shows the sameas FIG. 3 again to facilitate a comparison with FIG. 7B). If from theoptical axis center to the radius r of the section spot of thereproduced laser beam 12′ impinging upon the objective lens 19 isshielded using this phenomenon as shown in FIG. 7B, the position of theminimum circle of confusion is moved from δ to ε.

According to the present invention, detection characteristic upondetecting the spherical aberration is intensified using an amount ofshift from δ to ε of the position of the minimum circle of confusion asshown in FIGS. 7A (FIG. 3) and FIG. 7B.

To consider the condition of r for intensifying the spherical aberrationdetection most by characteristic analysis, the system shown in FIG. 8,which facilitates comparison with FIG. 5 described before will be usedas a calculation model.

If the thickness of the transparent protective layer 3 a changes by onlyδ t in the optical disk unit 10 shown in FIG. 2, as shown in FIG. 5, thelaser beam 12 reciprocates between the objective lens 19 and therecording layer 3 d, so that a spherical aberration equivalent to 2δ tis generated.

After that, when the laser beam 12 passes the sensitizing filter 27 fordetecting the spherical aberration before it impinges upon the sphericallens 28 of the detecting optical system, the characteristic of the laserbeam 12 changes partly.

“A pseudo spherical aberration generating/sensitizing filter functionprovided device 127”, which has a spherical aberration and functions asa sensitizing filter by converging a place where this sphericalaberration is generated and a portion in which the characteristic of thelaser beam 12 is changed to a portion just before the laser beam 12impinges upon the objective lens 19, will be described.

After the laser beam 12 passes the pseudo spherical aberrationgenerating/sensitizing filter function provided device 127 in FIG. 8,the thickness of the transparent protective layer 3 a maintains itsideal status. If the converging spot characteristic in the optical disk3 is enlarged with a detection optical system having a lateralmagnification M, the detection characteristic of the second photodetector 29 shown in FIG. 5 coincides with the detection characteristicof a second photo detector 129 shown in FIG. 8, which is a calculationmodel for analysis. Meanwhile, the enlargement characteristic(magnification) of the model shown in FIG. 8 can be converted easilyaccording to the expression (1).

FIG. 7B shows an example of the sensitizing filter which shields laserbeam impinging upon the objective lens 19 from the optical axis centerto its radius r. In FIG. 8, as the characteristic of the sensitizingportion of the pseudo spherical aberration generating/sensitizing filterfunction provided device 127, laser beam impinging upon the objectivelens 19 is split in terms of wavefront to three concentric regions withcircumferences of a radius b and a radius “a” as borders and bysubjecting only a ring region surrounded by the radius b and the radius“a” to attenuation of transmission light amount and phase change, thechange of a position ε in which the center intensity is maximized isanalyzed.

Because an optical device which gives attenuation of transmission lightamount and phase change to only the ring region surrounded by the radius“a” and the radius b is called apodizer in a special field of optics, aportion acting as a sensitizing filter for detecting sphericalaberration in the pseudo spherical aberration generating/sensitizingfilter function provided device 127 shown in FIG. 8 will be called“apodizer” in a following description.

Expressions (A-1) and (A-15) to be quoted in a following calculation arequoted from respective expressions described in H. Ando : Jpn. J. Appl.Phys. Vol. 38 (1999) Pt. 1 No. 2A p. 764 Appendix A and will beintroduced later. A detailed description for the introduction isomitted.

Coordinates on a pupil on a predetermined surface of the objective lens19 are defined to be (X, Y) while coordinates on a light convergingsurface of the optical disk 3 are defined to be (x, y). Because complexamplitude distribution G (x, y) of the light converging spot is in therelation of Fourier transformation relative to a pupil function g (X, Y)of the pupil on a predetermined surface of the objective lens 19, whenit is assumed that P₀ is a range of Fourier integration on the pupil ona predetermined surface of the objective lens 19, α is a standardizationconstant, f is a focal distance of the objective lens 19 and NA is thenumerical aperture of the objective lens 19, the wavelength of the laserbeam 12 is expressed in λ, so that it can be described as follows.G(x,y)=α F{g(X,Y)}_(P0)   (2-1)

If the intensity distribution of laser beam impinging upon the objectivelens 19 is approximated to Gauss distribution and it is assumed that theA/W value in the X-axis direction is σ x(=(A/W)_(x)) and the A/W valuein Y-axis direction is σ y(=(A/W)_(Y)) and a deviation amount of thecenter intensity due to lens shift of the objective lens 19 is X₀, afollowing expression can be introduced. $\begin{matrix}\begin{matrix}{\left( {X,Y} \right) = {\exp\left\{ {{{- \left( \frac{\sigma_{X}}{f \cdot {NA}} \right)^{2}}\left( {X + {Xo}} \right)^{2}} - {\left( \frac{\sigma_{Y}}{f \cdot {NA}} \right)^{2}Y^{2}}} \right\}}} \\{\approx {\exp\left\{ {{- \left( {{\left( \frac{\sigma_{X}}{f \cdot {NA}} \right)^{2}X^{2}} + {\left( \frac{\sigma_{Y}}{f \cdot {NA}} \right)^{2}Y^{2}}} \right)} - {{\left( \frac{\sigma_{X}}{f \cdot {NA}} \right)^{2} \cdot 2}{XoX}}} \right\}}}\end{matrix} & \left( {2\text{-}2} \right)\end{matrix}$where in the expression (2-2), X₀ is regarded to be so small that it canbe approximated to X₀ ²≈0.

If the above-described orthogonal coordinate system representation istransformed to polar coordinate system using $\begin{matrix}{r = \frac{\sqrt{X^{2} + Y^{2}}}{f\quad{NA}}} & \left( {2\text{-}3} \right) \\{\phi = {\tan^{- 1}\left( \frac{Y}{X} \right)}} & \left( {2\text{-}4} \right) \\{\rho = {{NA}\frac{\sqrt{X^{2} + Y^{2}}}{\lambda}}} & \left( {2\text{-}5} \right) \\{{\varphi = {\tan^{- 1}\left( \frac{Y}{X} \right)}}{{it}\quad{comes}}} & \left( {2\text{-}6} \right) \\{{\sigma^{2} \equiv \frac{{\sigma\quad x^{2}} - {\sigma\quad y^{2}}}{2}}{and}} & \left( {2\text{-}7} \right) \\{{\sigma_{-}^{2} \equiv {\frac{{\sigma\quad x^{2}} - {\sigma\quad y^{2}}}{2}.{Here}}},{if}} & \left( {2\text{-}8} \right) \\{\Delta_{OL} \equiv \frac{Xo}{f\quad{NA}}} & \left( {2\text{-}9} \right)\end{matrix}$is used, the expression (2-2) is transformed tog(r,φ)=exp {−σ² r ²−σ_(—) ² r ² cos(2φ)−2σ_(x) ²Δ_(OL) r cos φ}  (2-10)

The pupil function of the pupil on a predetermined surface of theobjective lens 19 when wavefront aberration ω(r,φ) occurs is formulatedas followsg(r,φ)=exp {−σ² r ²−σ_(—) ² r ² cos(2φ)−2σ_(x) ²Δ_(OL) r cosφ−ikω(r,φ)}  (2-11)andk=2π/λ  (2-12)

Meanwhile, when in the optical disk system, up to quartic or lower termis considered by polynomial development of the wavefront aberrationω(r,φ), it is desirable to consider in a condition that the sphericalaberration ω s isω s(r,ω)=ω₄₀(r ⁴ −Qr ² +R)   (2-13)and the defocus ω d isω d(r,φ)=ω₂₀ r ²   (2-14).

In the aforementioned expression (2-13), Q means an optimum value inwhich the center intensity is maximized according to movement theorem.In the expression (2-13), R is a phase term, which affects a mixingratio between a real part and an imaginary part of the complex amplitudedistribution although it does not affect the center intensity.

In Fourier transformation in polar coordinate system, Henkel'stransformation expression is applied andG(ρ,φ)=α H{g(r,φ)}_(P0)   (2-15)is expressed with respect to the expression (2-1). $\begin{matrix}{{{Then},{{if}\quad{the}\quad{expression}\quad\left( {2\text{-}11} \right)\quad{is}\quad{transformed}\quad{to}}}{{g\left( {r,\varphi} \right)} = {{\exp\left\{ {{{- \sigma^{2}}r^{2}} - {\sigma_{-}^{2}r^{2}{\cos\left( {2\varphi} \right)}} - {2\sigma_{x}^{2}\quad\Delta_{OL}r\quad\cos\quad\varphi}} \right\}} + {\left\{ {{\mathbb{e}}^{{- {\mathbb{i}}}\quad k\quad{\omega{({r,\varphi})}}} - 1} \right\}\quad\exp\quad\left\{ {{{- \sigma^{2}}r^{2}} - {\sigma_{-}^{2}r^{2}{\cos\left( {2\varphi} \right)}} - {2\sigma_{x}^{2}\quad\Delta_{OL}r\quad\cos\quad\varphi}} \right\}}}}} & \left( {2\text{-}16} \right)\end{matrix}$light converging spot amplitude distribution Gt(ρ,φ) is such thatGo(ρ,φ): light converging spot amplitude distribution when there is noaberration in a conventional optical system and Gw(ρ,φ): aberration termaffecting the light converging spot amplitude distribution of theconventional optical system andGt(ρ,φ)=Go(ρ,φ)+Gw(ρ,φ)   (2-17)is expressed, it comes thatG ₀(ρ,φ)=α H{ exp [−σ² r ²−σ_(—) ² r ² cos(2φ)−2σ_(x) ²Δ_(OL) r cos φ]}P₀   (2-18)andG _(w)(ρ,φ)=α H{[e ^(−ikω)(r,ω)−1] exp [−σ² r ² − . . . ]}P ₀   (2-19)

If Oiler's formulae−ikω(r,φ)=cos {kω(r,φ)}−i sin {kω(r,φ)}  (2-20)is applied to e^(−ikω)(r, φ), it is transformed toG _(W)(ρ,φ)=−α H{2 sin² [kω(r,φ)/2]·exp [−σ² r ² − . . . ]}P ₀ −iα H{2sin [kω(r,φ)/2]·cos [kω(r,φ)/2]·−exp [−σ² r ² − . . . ]}P ₀   (2-21)

When each value of σ, σ_, Δ_(OL) is a small value than 1 (1>σ, 1>σ_(—),1>Δ_(OL)), such an approximate expression asexp [−σ²r²−σ_(—) ²r² cos(2φ)−2σ_(x) ²Δ_(OL)r cos φ]≈1−σ²r²−σ_(—) ²r²cos(2φ)−2σ_(x) ²Δ_(OL)r cosφ  (2-22)is applied to the expression (2-18) and (2-19) and further, when eachvalue of σ_, Δ_(OL) is sufficiently smaller than 1 (1>>σ_(—),1>>Δ_(OL)), it is regarded asexp [−σ²r²−σ_(—) ²r² cos(2φ)−2σ_(x) ²Δ_(OL)r cos φ]≈1−σ²r²   (2-23)for calculation.

When the wavefront aberration ω(r, φ) is sufficiently smaller than 1(1>>kω),e^(−ikω)(r,φ)−1≈−ikω(r,φ)−{kω(r,φ)}²/2   (2-24)is applied to the expression (2-19) to make approximation.

When the inner circumference radius of a ring region of apodizer is b(corresponds to “r” in FIG. 7B) and the outer circumference radius is a(corresponds to “1” in FIG. 7A) while complex transmission amplitude inthe ring region is expressed in T, an apodizer of arbitrary shape (type)can be obtained by changing the setting condition of the value T.

That is, it is so defined that:

-   (A) if T is T=0, “completely shielding type apodizer”,-   (B) if T is T=−1, “phase type apodizer” in which the phase is    shifted by λ/2-   (C) if T is 1>T>0, “light amount damping type apodizer” which    reduces transmission light amount, and-   (D) if T is T=te^(iθ), “general type apodizer” in which phase shift    and light amount damping are generated at the same time.

Although the complex amplitude distribution G_(an1)(ρ,φ) of the lightconverging spot on the optical disk recording plane formed by lightpassing the ring region of the apodizer can be obtained by Henkeltransformation like in the expression (2-18), an integration range onthe pupil on a predetermined surface of the objective lens 19 is limitedwithin a ring region P_(an1).

That is,

[Expression 18]G_(an1)(σ,φ)≡α(1−T)H{ exp [−σ²r²−σ_(—) ²r² cos(2φ)−2σ_(x) ²Δ_(OL)r cosφ]}P_(an1)   (3-1)

Further, according to theorem of Bavinette, the complex amplitudedistribution Gt(ρ,φ) of the light converging spot formed by lightpassing the ring-like apodizer is expressed as followsGt(ρ,φ)=Go(ρ,φ)−G _(an1)(ρ,φ)   (3-2)according to the expressions (2-18) and (3-1).

Further, when an aberration occurs, an expression corresponding to the(2-17) can be expressed in the form ofGt(ρ,φ)=Go(ρ,φ)−G _(an1)(ρ,φ)+Gw(ρ,φ)−Gw _(an1)(ρ,φ)   (3-3)assuming that Go(ρ,φ) is an amplitude distribution of the lightconverging spot at the time having no aberration in the conventionaloptical system and G_(an1)(ρ,φ) is a converging light spot amplitudedistribution formed at the time having no aberration, by light passingthe ring region of the apodizer.

A peak efficiency η is defined as an important parameter which affectsthe light converging spot characteristic largely, the expression$\begin{matrix}{\eta \equiv \frac{{{{G_{0}\left( {0,\varphi} \right)} - {G_{{an}\quad 1}\left( {0,\varphi} \right)}}}^{2}}{{{G_{0}\left( {0,\varphi} \right)}}^{2}}} & \left( {3\text{-}4} \right)\end{matrix}$means a ratio of the center intensity of the light converging spotdepending on presence or absence of the apodizer.

Further, as another important parameter, the radius c of the centerportion of the ring region is defined asc≡(a+b)/2   (3-5)

Meanwhile, the center intensity of the light converging spot at the timehaving no aberration is standardized to “1”.

That is,|G ₀(0,φ)−G _(an1)(0,φ)|²=1   (3-6)is set up.

If the expression (3-4) is substituted for the expression (3-6),G ₀(0,φ)=1/√{square root over (η)}  (3-7)is obtained.

On the other hand, in the expression (2-18), if σ_ and Δ_(OL) aresufficiently smaller than 1, in case of σ_(—), 1>>Δ_(OL),$\begin{matrix}\begin{matrix}{{G_{0}\left( {0,\psi} \right)} \approx {\alpha\quad H\left\{ {\exp\left\lbrack {{- \sigma^{2}}r^{2}} \right\rbrack} \right\} P_{0}}} \\{= {2\pi\quad\alpha{\int_{0}^{1}{r\quad{\exp\left\lbrack {{- \sigma^{2}}r^{2}} \right\rbrack}{\mathbb{d}r}}}}} \\{= {\frac{\pi\alpha}{\sigma^{2}}\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}}}\end{matrix} & \left( {3\text{-}8} \right)\end{matrix}$is obtained according to the expressions (A-1) and (A-13).

Thus, by using the expressions (3-7) and (3-8), the standard constant αcan be obtained as follows. $\begin{matrix}{\alpha \approx \frac{\sigma^{2}}{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}\pi\sqrt{\eta}}} & \left( {3\text{-}9} \right)\end{matrix}$

If σ, σ_, and Δ_(OL) obtain relatively small values as other condition,the following expression is obtained by approximation based on theexpressions (A-5), (A-7), (A-8) and (A-13). $\begin{matrix}\begin{matrix}{{G_{0}\left( {\rho,\psi} \right)} \approx {\alpha\quad H\left\{ {1 - {\sigma^{2}r^{2}} - {\sigma_{-}^{2}r^{2}{\cos\left( {2\varphi} \right)}} - {2\sigma\quad x^{2}\Delta_{OL}r\quad\cos\quad\varphi}} \right\} P_{0}}} \\{= {\pi\quad{\alpha\left( {1 - {\sigma^{2}/2}} \right)}}}\end{matrix} & \left( {3\text{-}10} \right)\end{matrix}$

Therefore, the expression (3-9) is transformed to $\begin{matrix}{\alpha \approx \frac{1}{\left( {1 - {\sigma^{2}/2}} \right)\pi\sqrt{\eta}}} & \left( {3\text{-}11} \right)\end{matrix}$

Further, by substituting the expression (3-11) for the expression(2-18), $\begin{matrix}\begin{matrix}{{G_{0}\left( {\rho,\psi} \right)} \approx {\alpha\quad H\left\{ {1 - {\sigma^{2}r^{2}} - {\sigma_{-}^{2}r^{2}{\cos\left( {2\varphi} \right)}} - {2\sigma_{x}^{2}\Delta_{OL}r\quad\cos\quad\varphi}} \right\} P_{0}}} \\{= \frac{\begin{matrix}{{{J_{1}\left( {2{\pi\rho}} \right)}/({\pi\rho})} - {\sigma^{2}{M_{20}(\rho)}} +} \\{{\sigma_{-}^{2}{M_{22}(\rho)}\quad\cos\quad\left( {2\varphi} \right)} + {{\mathbb{i}2\sigma}_{x}^{2}\Delta_{OL}{M_{11}(\rho)}\cos\quad\varphi}}\end{matrix}}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}}\end{matrix} & \left( {3\text{-}12} \right)\end{matrix}$is introduced from the expression (A-13).

In this expression (3-12), M_(mV)(ρ) means an integration definitionexpression including Bessel function defined according to the expression(A-5).

Further, if the expressions (2-22), (3-11) and (A-14) are applied to theexpression (3-1), $\begin{matrix}\begin{matrix}{\left. {{G_{{an}\quad 1}\left( {\rho,\psi} \right)} \approx {{\alpha\left( {1 - T} \right)}H\begin{Bmatrix}{1 - {\sigma^{\quad 2}r^{\quad 2}} - {\sigma_{-}^{2}r^{\quad 2}\cos\quad\left( {2\varphi} \right)} -} \\{2\sigma_{\quad x}^{\quad 2}\Delta_{\quad{OL}}r\quad\cos\quad\varphi}\end{Bmatrix}}} \right\} P_{{an}\quad 1}} \\{= {\frac{2\left( {1 - T} \right)\left( {a - b} \right)}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}\begin{Bmatrix}{{c\left( {1 - {{\sigma 2c}\quad 2}} \right){J_{\quad 0}\left( {2\pi\quad c\quad\rho} \right)}} +} \\{{\sigma_{-}^{2}c^{3}{J_{2}\left( {2\pi\quad c\quad\rho} \right)}\cos\quad\left( {2\varphi} \right)} -} \\{{\mathbb{i}2\sigma}_{x}^{2}\Delta_{OL}c^{2}{J_{1}\left( {2\pi\quad c\quad\rho} \right)}\cos\quad\psi}\end{Bmatrix}}}\end{matrix} & \left( {3\text{-}13} \right)\end{matrix}$is obtained.

If the apodizer which generates general phase shift and light amountdamping at the same time is employed in the expression (3-13), T obtainsa complex number (T=te^(iθ)).

Here, ifε(c)≡2(a−b)c(1−σ²c²)   (3-14)is defined and Oiler's formula is applied to the complex number T likein the expression (2-20), the expression (3-13) is transformed to$\begin{matrix}{{G_{{an}\quad 1}\left( {\rho,\psi} \right)} \approx {\frac{\left( {1 - {t\quad\cos\quad\theta}} \right) - {{\mathbb{i}}\quad t\quad\sin\quad\theta}}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}{ɛ(c)} \times \begin{Bmatrix}{{J_{0}\left( {2\pi\quad c\quad\rho} \right)} + {\frac{\quad{\sigma_{-}^{2}\quad c}}{\quad{1 - {\sigma^{2}\quad c^{2}}}}J_{2}\left( {2\pi\quad c\quad\rho} \right)\cos\quad\left( {2\varphi} \right)} +} \\{{\mathbb{i}}\frac{2\quad\sigma_{\quad x}^{\quad 2}\quad\Delta_{\quad{OL}}\quad c}{\quad{1 - {\sigma^{2}\quad c^{2}}}}{J_{1}\left( {2\pi\quad c\quad\rho} \right)}\cos\quad\varphi}\end{Bmatrix}}} & \left( {3\text{-}15} \right)\end{matrix}$

Particularly, because at the position of ρ=0 (center amplitude positionof light converging spot), $\begin{matrix}{{{G_{0}\left( {0,\psi} \right)} - {G_{{an}\quad 1}\left( {0,\psi} \right)}} \approx \frac{\begin{matrix}{\left( {1 - {\sigma^{2}/2}} \right) - {{ɛ(c)}\left( {1 - {t\quad\cos\quad\theta}} \right)} +} \\{{\mathbb{i}ɛ}\quad(c)t\quad\sin\quad\theta}\end{matrix}}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}} & \left( {3\text{-}16} \right)\end{matrix}$can be introduced from the expressions (3-7), (3-15) and (A-1),

if the expression (3-16) is substituted for the expression (3-6), arelation about ηε²(c)(1−2t cos θ+t ²)=−{(1−η)(1−σ²/2)²−(2−σ²)ε(c)(1−t cos θ)}  (3-17)can be obtained.

As a special case, $\begin{matrix}{{1 - \sqrt{\eta}} = {\frac{2\left( {1 - T} \right)}{1 - {\sigma^{2}/2}}\left( {a - b} \right){c\left( {1 - {\sigma^{2}c^{2}}} \right)}}} & \left( {3\text{-}18} \right)\end{matrix}$(3-18) is introduced from the expressions (3-6) and (3-16) if T is areal number.

If the expression (3-18) is substituted for the expression (3-13), anapproximate expression $\begin{matrix}{{G_{{an}\quad 1}\left( {\rho,\psi} \right)} \approx {\frac{1 - \sqrt{\eta}}{\sqrt{\eta}}\begin{Bmatrix}{{J_{\quad 0}\left( {2\pi\quad c\quad\rho} \right)} + {\frac{\sigma -^{2}{c^{3}{\cos\left( {2\varphi} \right)}}}{1 - {\sigma^{2}c^{2}}}{J_{2}\left( {2\pi\quad c\quad\rho} \right)}} +} \\{{\mathbb{i}}\frac{2\sigma_{x}^{2}\Delta_{OL}C^{2}\cos\quad\varphi}{1 - {\sigma^{2}c^{2}}}{J_{1}\left( {2\pi\quad c\quad\rho} \right)}}\end{Bmatrix}}} & \left( {3\text{-}19} \right)\end{matrix}$is obtained.

Meanwhile, if σ_ and Δ_(OL) are sufficiently smaller than 1(1>>σ_(—), 1) Δ_(OL)), the expressions (3-12) and (3-19) can betransformed to $\begin{matrix}{{{G_{0}\left( {\rho,\psi} \right)} \approx \frac{{{J_{1}\left( {2{\pi\rho}} \right)}/({\pi\rho})} - {\sigma^{2}{M_{20}(\rho)}}}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}}{and}} & \left( {3\text{-}20} \right) \\{{G_{{an}\quad 1}\left( {\rho,\psi} \right)} \approx {\frac{1 - \sqrt{\eta}}{\sqrt{\eta}}{J_{0}\left( {2\pi\quad c\quad\rho} \right)}}} & \left( {3\text{-}21} \right)\end{matrix}$

On the other hand, wavefront aberration when the spherical aberrationand defocus occur at the same time can be expressed as follows,according to the expressions (2-13) and (2-14).ω s(r,φ)=ω₄₀(r ⁴ −Qr ² +R)+ω′₂₀ r ²   (10-1)

Here, assumingω₂₀=ω′₂₀ −Qω ₄₀, ω₀₀≡ω₄₀ R   (10-2),the expression (10-1) can be transformed toω s(r,φ)=ω₄₀ r ⁴+ω₂₀ r ²+ω₀₀   (10-3).

If in the expression (2-10), σ_ and Δ_(OL) are sufficiently smaller than1 (1>>σ_(—), 1>>Δ_(OL)), the expressions (3-9) and (10-3) aresubstituted for the expression (2-11) and the expression (A-13) isemployed, $\begin{matrix}{\quad{{{G_{WS}\left( {\rho,\psi} \right)} = {{{Real}\quad\left\{ {G_{WS}\left( {\rho,\psi} \right)} \right\}} + {{\mathbb{i}}\quad{Img}\left\{ {G_{WS}\left( {\rho,\psi} \right)} \right\}}}},{{{Real}\quad\left\{ {G_{WS}\left( {\rho,\psi} \right)} \right\}} \approx {{{- \alpha}\quad H\quad\left\{ {2\quad{\sin^{2}\left\lbrack {k\quad\omega\quad{{s\left( {r,\varphi} \right)}/2}} \right\rbrack}{\exp\left( {{- \sigma^{2}}r^{2}} \right)}} \right\} P\quad 0} - \frac{4\quad\sigma^{2}}{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}\sqrt{\eta}}}}}} & \left( {10\text{-}4} \right) \\{{\int_{0}^{1}{r\quad\sin^{2}{\left\{ {{k\left( {{\omega_{40}r^{4}} + {\omega_{20}r^{2}} + \omega_{00}} \right)}/2} \right\} \cdot {\exp\left( {{- \sigma^{2}}r^{2}} \right)}}{J_{0}\left( {2{\pi\rho}\quad r} \right)}{\mathbb{d}r}}}\quad{and}} & \left( {10\text{-}5} \right) \\{{{Img}\left\{ {G_{WS}\left( {\rho,\psi} \right)} \right\}} \approx {{{- \alpha}\quad H\left\{ {{\sin\left\lbrack {k\quad\omega\quad{s\left( {r,\varphi} \right)}} \right\rbrack}{\exp\left( {{- \sigma^{\quad 2}}r^{\quad 2}} \right)}} \right\} P\quad 0} - {\frac{2\sigma^{2}}{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}\sqrt{\eta}}{\int_{0}^{1}{r\quad\sin\left\{ {k\begin{pmatrix}{{\omega_{40}r^{4}} +} \\{{\omega_{20}r^{2}} + \omega_{\quad 00}}\end{pmatrix}} \right\}{\exp\left( {{- \sigma^{2}}r^{2}} \right)}{J_{0}\left( {2\pi\quad\rho\quad r} \right)}{\mathbb{d}r}}}}}} & \left( {10\text{-}6} \right)\end{matrix}$can be obtained.

If the apodizer which generates the phase shift and light amount dampingat the same time is employed, by using the expressions (2-19) to (2-21),(3-1), (3-9), (10-3) and (A-14), $\begin{matrix}\begin{matrix}{{G_{{wsan}\quad 1}\left( {\rho,\psi} \right)} = {{- \alpha}{\left\{ {\left( {1 - {t\quad\cos\quad\theta}} \right) - {{\mathbb{i}t}\quad\sin\quad\theta}} \right\} \cdot H}\begin{Bmatrix}{\left\lbrack {1 - {\mathbb{e}}^{{- {\mathbb{i}}}\quad k\quad\omega\quad{s{({r,\varphi})}}}} \right\rbrack \cdot} \\{\exp\left( {{- \sigma^{2}}r^{2}} \right)}\end{Bmatrix}P_{{an}\quad 1}}} \\{= {{{Real}\quad\left\{ {G_{{wsan}\quad 1}\left( {\rho,\psi} \right)} \right\}} + {{\mathbb{i}}\quad{Img}\left\{ {G_{{wsan}\quad 1}\left( {\rho,\psi} \right)} \right\}}}}\end{matrix} & \left( {10\text{-}7} \right) \\{{{{Real}\left\{ {G_{{wsan}\quad 1}\left( {\rho,\psi} \right)} \right\}} = {{- \frac{2{\sigma^{2}\left( {a - b} \right)}c}{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}\sqrt{\eta}}}{{\exp\left( {{- \sigma^{2}}r^{2}} \right)} \cdot {J_{0}\left( {2\pi\quad c\quad\rho} \right)}} \times \begin{Bmatrix}{{2\left( {1 - {t\quad\cos\quad\theta}} \right){\sin^{2}\left\lbrack {{k\left( {{\omega_{40}c^{4}} + {\omega_{20}c^{2}} + \omega_{00}} \right)}/2} \right\rbrack}} +} \\{t\quad\sin\quad\theta\quad{\sin\left\lbrack {k\left( {{\omega_{40}c^{4}} + {\omega_{20}c^{2}} + \omega_{00}} \right)} \right\rbrack}}\end{Bmatrix}}}{and}} & \left( {10\text{-}8} \right) \\{{{Img}\left\{ {G_{{wsan}\quad 1}\left( {\rho,\psi} \right)} \right\}} = {{- \frac{2{\sigma^{2}\left( {a - b} \right)}c}{\left\{ {1 - {\exp\left( {- \sigma^{2}} \right)}} \right\}\sqrt{\eta}}}{{\exp\left( {{- \sigma^{2}}c^{2}} \right)} \cdot {J_{0}\left( {2\pi\quad c\quad\rho} \right)}} \times \begin{Bmatrix}{{\left( {1 - {t\quad\cos\quad\theta}} \right){\sin\left\lbrack {k\left( {{\omega_{40}c^{4}} + {\omega_{20}c^{2}} + \omega_{00}} \right)} \right\rbrack}} -} \\{2t\quad\sin\quad\theta\quad{\sin^{2}\left\lbrack {{k\left( {{\omega_{40}c^{4}} + {\omega_{20}c^{2}} + \omega_{00}} \right)}/2} \right\rbrack}}\end{Bmatrix}}} & \left( {10\text{-}9} \right)\end{matrix}$can be obtained.

According to the present invention, the value Q indicated in theexpression (2-13) is calculated under a condition that and ω₄₀ and σ arerelatively small values. Here, in the pupil function indicated in theexpression (2-16), it is regarded that σ_(—)≈0 and Δ_(OL)≈0.

Further, in a detailed description below, it is regarded that R=0.0because a phase term R does not affect the center intensity.

If the expressions (2-23), (2-24), (3-11) are applied to the expressions(10-4) to (10-9), the expressions (10-5), (10-6), (10-8), and (10-9) areapproximated to $\begin{matrix}{{{Real}\quad\left\{ {G_{WS}\left( {0,\phi} \right)} \right\}} \approx {{{- \alpha}\quad H\left\{ {\left\lbrack {\left( {{k\quad\omega_{40}r^{4}} + {k\quad\omega_{20}r^{2}}} \right)^{2}/2} \right\rbrack\left( {1 - {\sigma^{2}r^{2}}} \right)} \right\} P\quad 0} - {\frac{1}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}\begin{Bmatrix}{{\left( {\frac{1}{6} - \frac{\sigma^{2}}{8}} \right)k^{2}\omega_{20}^{2}} +} \\{{\left( {\frac{1}{\quad 4} - \frac{\quad\sigma^{\quad 2}}{\quad 5}} \right)k\quad\omega_{\quad 20}k\quad\omega_{\quad 40}} + {\left( {\frac{1}{10} - \frac{\sigma^{2}}{12}} \right)k^{2}\omega_{40}^{2}}}\end{Bmatrix}}}} & \left( {10\text{-}10} \right) \\{{{Img}\left( {G_{WS}\left( {0,\phi} \right)} \right)} \approx {{{- \alpha}\quad H\begin{Bmatrix}{\left( {{k\quad\omega_{\quad 40}r^{\quad 4}} + {k\quad\omega_{\quad 20}r^{\quad 2}}} \right) \cdot} \\\left( {1 - {\sigma^{2}r^{2}}} \right)\end{Bmatrix}P\quad 0} - {\frac{1}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}\left\{ {{\left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)k\quad\omega_{20}} + {\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)k\quad\omega_{40}}} \right\}}}} & \left( {10\text{-}11} \right) \\{{{{Real}\quad\left\{ {G_{{wsan}\quad 1}\left( {0,\phi} \right)} \right\}} \approx {{- \frac{1}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}} \times \quad\begin{Bmatrix}{{\left( {1 - {t\quad\cos\quad\theta}} \right){\left( {{k\quad\omega_{40}c^{4}} + {k\quad\omega_{20}c^{2}}} \right)^{2}/2}} +} \\{t\quad\sin\quad{\theta\left( {{k\quad\omega_{40}c^{4}} + {\omega_{20}c^{2}}} \right)}}\end{Bmatrix}}}{and}} & \left( {10\text{-}12} \right) \\{{{Img}\quad\left\{ {G_{{wsan}\quad 1}\left( {0,\phi} \right)} \right\}} \approx {{- \frac{ɛ(c)}{\left( {1 - {\sigma^{2}/2}} \right)\sqrt{\eta}}} \times \begin{Bmatrix}{{\left( {1 - {t\quad\cos\quad\theta}} \right)\left( {{k\quad\omega_{40}c^{4}} + {k\quad\omega_{20}c^{2}}} \right)} -} \\{t\quad\sin\quad{{\theta\left( {{k\quad\omega_{40}c^{4}} + {\omega_{20}c^{2}}} \right)}^{2}/2}}\end{Bmatrix}}} & \left( {10\text{-}13} \right)\end{matrix}$

Here, ifAs+iBs≡G₀(0,φ)−G_(an1)(0,φ)   (10-14)andCs+iDs≡G_(ws)(0,φ)−G_(wsan1)(0,φ)   (10-15)are set up,|Gt(0,φ)|²≈(As²+Bs²)+(Cs²+Ds²)+(2AsCs+2BsDs)   (10-16)is obtained.

Then, if the expressions (3-14), (3-16), (10-4), (10-7), (10-10) to(10-13) are substituted for |Gt(0,φ)|²≈(As²+Bs²)+(Cs²+Ds²)+(2AsCs+2BsDs)(10-16) and the expression (3-17) is applied, $\begin{matrix}{{{{Gt}\left( {0,\phi} \right)}}^{2} \approx {1 - {\frac{1}{\left( {1 - {\sigma^{2}/2}} \right)^{2}\eta}\begin{Bmatrix}{{S_{A}\left( {{k\quad\omega_{20}} + \frac{{S_{B}k\quad\omega_{40}} + {Sc}}{2\quad S_{A}}} \right)}^{2} +} \\{{S_{D}k^{2}\omega_{40}^{2}} + {S_{E}k\quad\omega_{40}} + S_{F}}\end{Bmatrix}}}} & \left( {10\text{-}17} \right) \\{S_{A} = {{\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)\left( {1 - \frac{\sigma^{2}}{2}} \right)} - \left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)^{2} - {\left\{ {\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right) - {\left( {1 - \frac{2\quad\sigma^{2}}{3}} \right)c^{2}} + {\left( {1 - \frac{\sigma^{2}}{4}} \right)c^{4}}} \right\}{ɛ(c)}\left( {1 - {t\quad\cos\quad\theta}} \right)}}} & \left( {10\text{-}18} \right) \\{{S_{B} = {{\left( {\frac{1}{2} - \frac{2\sigma^{2}}{5}} \right)\left( {1 - \frac{\sigma^{2}}{2}} \right)} - {\left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)\left( {\frac{2}{3} - \frac{\sigma^{2}}{2}} \right)} - {\begin{Bmatrix}{\left( {\frac{1}{\quad 2} - \frac{2\quad\sigma^{\quad 2}}{\quad 5}} \right) - {\left( {\frac{2}{3} - \frac{\sigma^{2}}{2}} \right)c^{2}} -} \\{{\left( {1 - \frac{2\quad\sigma^{2}}{3}} \right)c^{\quad 4}} + {\left( {2 - \sigma^{2}} \right)c^{6}}}\end{Bmatrix}{ɛ(c)}\left( {1 - {t\quad\cos\quad\theta}} \right)}}}{and}} & \left( {10\text{-}19} \right) \\{{Sc} = {\left\{ {\left( {1 - \frac{2\sigma^{2}}{3}} \right) - {\left( {2 - \sigma^{2}} \right)c^{2}}} \right\}{ɛ(c)}t\quad\sin\quad\theta}} & \left( {10\text{-}20} \right)\end{matrix}$are obtained.

On the other hand, according to the expression (10-17), the value ofGt(0, φ)² when ω₂₀ turns to its maximum value under the condition of“SA>0” is automatically determined so that the following expression isobtained. $\begin{matrix}{\omega_{20} = {- \frac{{S_{B}k\quad\omega_{40}} + S_{c}}{2S_{A}}}} & \left( {10\text{-}21} \right)\end{matrix}$

Particularly, when kω₄₀=0, the expression (10-21) is as follows:kω ₂₀ =−S _(C)/2S _(A)   (10-22)

If a phase difference of angle θ occurs in light passing the ring regionof the apodizer, the center intensity of the light converging spot ismaximized at a position ω₂₀ in which a focal point obtained according tothe expression (10-22) is shifted. A detailed consideration upon thisphenomenon will be described later.

If as the style of the apodizer, T is a real number (shielding typeapodizer, light amount damping type apodizer or phase type apodizershifting the phase by λ/2), it comes that sin θ≈0. If a relation of theexpressions (3-18), (10-2), (10-18), (10-19) and (10-21) is employed,the value Q in the expression (2-13) can be expressed in $\begin{matrix}{Q = {{{- \omega_{20}}/\omega_{40}} \approx {S_{B^{\prime}}/S_{A^{\prime}}}}} & \left( {10\text{-}23} \right) \\{{S_{A^{\prime}} = {{\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)\left( {1 - \frac{\sigma^{2}}{2}} \right)} - \left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)^{2} - {\begin{Bmatrix}{{\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)\left( {1 - \frac{2\sigma^{2}}{2}} \right)c^{2}} +} \\{\left( {1 - \frac{\sigma^{2}}{2}} \right)c^{4}}\end{Bmatrix}\left( {1 - \frac{\sigma^{2}}{2}} \right)\left( {1 - \sqrt{\eta}} \right)}}}{and}} & \left( {10\text{-}24} \right) \\{S_{B^{\prime}} = {{\left( {\frac{1}{4} - \frac{\sigma^{2}}{5}} \right)\left( {1 - \frac{\sigma^{2}}{2}} \right)} - {\left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)} - {\begin{Bmatrix}{\left( {\frac{1}{4} - \frac{\sigma^{2}}{5}} \right) - {\left( {\frac{1}{3} - \frac{\sigma^{2}}{4}} \right)c^{2}} -} \\{{\left( {\frac{1}{2} - \frac{\sigma^{2}}{3}} \right)c^{4}} + {\left( {1 - \frac{\sigma^{2}}{2}} \right)c^{6}}}\end{Bmatrix}\left( {1 - \frac{\sigma^{2}}{2}} \right)\left( {1 - \sqrt{\eta}} \right)}}} & \left( {10\text{-}25} \right)\end{matrix}$

From the expressions (10-23) to (10-25), it is made evident that thevalue Q indicating a defocus position in which the center intensity whenthe spherical aberration is generated is maximized does not depend onthe spherical aberration. Meanwhile, FIG. 9 shows changes of the value Qwhen c and σ introduced from the expressions (10-23) and (10-25) change.

As evident from FIG. 9, the value Q is substantially “1” or a value inthe vicinity thereof. That is, when the apodizer is used, undercondition of σ=0.7, the value Q is increased as compared to theconventional optical system (η=100%) at a position c>0.67 and 0.44>c.

In 0.67>c>0.44, it can be recognized that the value Q is decreasedslightly. Further, this tendency becomes more conspicuous as the peakefficiency η decreases. Meanwhile, under the condition of σ=0.0, thevalue Q is increased as compared to the conventional optical system(η=100%) in a range of c>0.70 and 0.45>c.

Consequently, the value Q is decreased slightly in the range of0.70>c>0.45.

Therefore, under any condition, the value Q is increased at the positionof c<0.44 and the value Q is decreased at the position of 0.45<c<0.67.

ω₄₀ corresponds to a spherical aberration amount as described previouslyand as shown in the expression (2), ω₂₀ indicates a shift amount δ z ofa center intensity maximum position within the information recordingmedium 3 when the spherical aberration occurs.

Therefore, it is indicated that under the condition in which the value Qis larger than the conventional system (η=1), the spherical aberrationdetecting sensitivity increases so that the effect of a sensitizingfilter is produced.

Because as indicated by the expression (3-5), c is the radius of thecenter portion of the ring region and it sometimes comes that b=0, anecessary condition for exerting the sensitizing characteristic of thesensitizing filter 127 for detecting the spherical aberration having anopening of a predetermined radius (r) shown in FIG. 7B is as follows.r≦0.88=0.44×2   (11)

In conclusion, the sensitizing filter 27 for use in detecting thespherical aberration in the optical disk unit 10 shown in FIG. 2 is soconstructed to be capable of damping light amount of the laser beam 12′within a range satisfying the aforementioned expression (11), changingthe phase characteristic of the laser beam 12′ or changing the phasecharacteristic while damping the light amount of the laser beam 12′ whenthe radius of the spot section of the laser beam 12′ is set to “1”.

The sensitizing filter 27 for detecting the spherical aberration isformed entirely of glass or a transparent plastic plate having apredetermined thickness. As a method for changing the light amount ofthe laser beam 12′, transmission light amount damping film made ofgelatine, metal, or inorganic material called ND filter is formedpartially or in a range satisfying the expression (11).

As a method for forming a change in the phase characteristic, generally,a transparent inorganic film of S_(i)O₂ or the like is formed in a rangesatisfying the expression (11) of the aforementioned transparent plateand unevenness is formed locally. According to this method, thethickness of the sensitizing filter 27 for detecting the sphericalaberration is changed locally so as to induce a change in phasepartially in the spot section of transmitting laser beam 12′.Consequently, the same effect as when the sensitivity to the laser beam12′ is intensified is obtained.

The features of an optical disk unit shown in FIG. 2 and an optical headand an information recording/reproducing apparatus having the sameoptical head shown in FIG. 1 will be described by exemplifying thestructure of the information recording/reproducing apparatus shown inFIG. 1. Even if a spherical aberration is generated due to a thicknessunevenness of the covering layer 3 a in the optical disk 3 by activatingthe defocus correcting circuit 105 using the defocus detecting system102 having a high detection accuracy and a high reliability, a thicknessunevenness of the covering layer (transparent protective layer) 3 a ofthe optical disk 3 or a spherical aberration, which is generated whenlaser beam is focused on any of the recording layer 3 d near thesubstrate or the recording layer 3 b near the covering layer is detectedand the spherical aberration correcting mechanism 101 is driven so as tocorrect the thickness unevenness (spherical aberration).

Referring to FIG. 2, for example, if the thickness unevenness correctingconvex lens 17 is moved in order to correct the spherical aberration,although laser beam 12 of the light transmission system is of parallelbeam before the thickness unevenness correcting convex lens 17 is moved,in a condition just before it passes the thickness unevenness correctingconvex lens 17 and enters the objective lens 19, it changes to divergentlight or convergent light. On the other hand, because convergenceprovided to the laser beam 12 by the objective lens 19 is constant, aconverging position of the laser beam 12 focused to the optical disk 3is changed.

In a defocus detection/correction control circuit system 111 of theoptical disk unit 10 shown in FIG. 2, its control is carried out so thatthe aforementioned light converging position coincides with therecording layer 3 d or the recording layer 3 b in the optical disk 3.Consequently, a thickness unevenness detection/correction controlcircuit system 114 is activated so as to correct the sphericalaberration and at the same time, the defocus detection/correctioncontrol circuit system 111 is affected. Because an interference(cross-talk) occurs between the thickness unevennessdetection/correction control circuit system 114 and the defocusdetection/correction control circuit system 111, both the “defocuscorrection control” and “thickness unevenness correction control” becomeconsiderable unstable.

To reduce this problem, the interference (cross-talk) between the“defocus correction control” and “thickness unevenness correctioncontrol” is reduced by changing a response speed of the defocuscorrection control and thickness unevenness correction control.

FIG. 10 is a graph for comparing the frequency characteristic (transferfunction) of each of the defocus correction control circuit and thethickness unevenness correction control circuit.

As shown in FIG. 10, according to the present invention, servo gain ofDC level of the frequency characteristic (transfer function) of thedefocus correcting control circuit and the thickness unevennesscorrecting control circuit is set up so that a DC gain Gof of thedefocus correction control circuit is much larger than a DC gain Got ofthe thickness unevenness correction control circuit. Further, thecut-off frequency, which is a response frequency at the time when gainis single time indicating a limit of applicability of correctioncontrol, is set up so that the cut-off frequency of the defocuscorrection control circuit is larger than the cut-off frequency fct ofthe thickness unevenness correction control circuit, that is,fcf≧fct   (12)

In the optical disk unit 10, the setting shown in the expression (12) isattained easily by each of the gain/band setting circuit 58 and thegain/band setting circuit 83. That is, because although not shown,linear amplifier gain can be adjusted by for example, adjustment ofresistance ratio in each of the gain/band setting circuit 58 and thegain/band setting circuit 83, the DC gains Gof and Got can be set upindependently.

Further, the cut-off frequencies fcf and fct, which are determineddepending on setting of the DC gains Gof and Got can be automaticallydetermined due to the structure of a driving mechanism (defocuscorrecting coil 20 and track shift correcting coil 21) of the objectivelens 19 and the structure of a driving mechanism (thickness unevennesscorrecting coil 18) of the thickness unevenness correcting convex lens17. Meanwhile, in the optical disk unit 10 shown in FIG. 2, although notshown, it is permissible to set up the cut-off frequencies fcf and fctpositively by disposing a low-pass filter contained a pair of acapacitor and a resistor in each of the gain/band setting circuit 58 andthe gain/band setting circuit 83.

As described above, an effect that the servo gain of the DC level of thefrequency characteristic (transfer function) of the defocus correctioncontrol circuit and the thickness unevenness correction control circuitis set up so that the DC gain Gof of the defocus correction controlcircuit is much larger than the DC gain Got of the thickness unevennesscorrection control circuit, will be described.

For example, if the thickness of the covering layer 3 a of the opticaldisk 3 changes suddenly or the recording layer on which light from theobjective lens 19 is focused is changed from 3 b to 3 d or from 3 d to 3b, the thickness unevenness detection/correction control circuit system114 is activated so that the thickness unevenness correcting convex lens17 is moved in a predetermined direction by a predetermined amount(distance).

However, because the cut-off frequency fct of the thickness unevennessdetection/correction control circuit system 114 is sufficiently lowerthan the cut-off frequency fct of the correction control circuit system111, the thickness unevenness correcting convex lens 17 is moved slowly.On the other hand, because the cut-off frequency fcf of the correctioncontrol circuit system 111 is several times higher than the cut-offfrequency fct of the thickness unevenness detection/correction controlcircuit system 114, the position of the objective lens 19 is adjustedmore quickly than the thickness unevenness correcting convex lens 17.

As a result, even while the thickness unevenness correcting convex lens17 is being moved, the focus of the objective lens 19 is maintained at ahigh precision.

As a result of a confirmation experiment, to obtain the above-describedeffect, the cut-off frequency fcf of the defocus correction controlcircuit needs to be about twice higher than the cut-off frequency fct ofthe thickness unevenness correction control circuit and to stabilize thecorrection control to some extent, the fcf is desired to be 10 times ormore higher than the fct.

That is, as an independent condition, the condition offcf≧2fct   (13)is necessary and preferably, iffcf≧10fct   (14),the effect of the thickness unevenness correction is intensified.

FIGS. 11A to 11D are schematic diagrams for explaining thecharacteristic of the defocus detecting signal and the characteristic ofthe thickness unevenness detecting signal in the optical disk unit 10(optical head and information recording/reproducing apparatus having thesame optical head shown in FIG. 1) shown in FIG. 2.

In FIG. 11A, the horizontal axis indicates a defocus detecting signalwith respect to a relative position between the objective lens 19 andthe optical disk 3 and the vertical axis indicates an output signal fromthe subtractor shown in FIG. 2, for example.

As shown in FIG. 2, the optical disk 3 includes the second recordinglayer 3 d (near the substrate) and the first recording layer 3 b (nearthe covering layer), those layers being laid successively and therefore,the defocus detecting signal is subjected to “0” cross (the signal levelpasses a reference level) at two positions of the recording layer 3 dand the recording layer 3 b.

In FIG. 11B, the horizontal axis indicates a defocus detecting signal ata relative position of the objective lens 19 to the optical disk 3 andits vertical axis indicates changes of total light amount of thereproduced laser beam 12′ irradiated on the photo detecting cells 25 a,25 b, 25 c and 25 d of the first photo detector 25, or for example,output signal of the adder 81 in FIG. 2.

The level of the sum signal outputted from the adder 81 reaches itsmaximum value in the vicinity of a position of the upper recording layer3 d and in the vicinity of the lower recording layer 3 b, and at otherposition, that is, if the objective lens 19 deviates so that light isnot focused on any recording layer, the spot size of the reproducedlaser beam 12′ focused on each of the photo detecting cells 25 a, 25 b,25 c and 25 d in the first photo detector 25 is increased, so that itprojects from each of the photo detecting cells 25 a, 25 b, 25 c and 25d, thereby reducing the level of the sum signal largely.

For example, the laser beam 12 is converged to the recording layer 3 d(near the substrate) of the optical disk 3 or in the vicinity thereofand if the spherical aberration is corrected corresponding to the focuscondition, detection characteristic shown in FIGS. 11C and 11D isobtained.

If the light converging position (near the covering layer) of the laserbeam 12 is moved from a condition in which the detection signal shown inFIGS. 11C and 11D is obtained to the upper recording layer 3 b, adifference signal and a sum signal for detecting the defocus change asshown in FIGS. 11A and 11B. After that, the defocus is detected in thelower recording layer 3 b and a predetermined control for correction iscarried out.

According to the present invention, as shown in the expressions (12) to(14), the defocus correction about the objective lens 19 is carried outat a speed of 2 to 10 times as compared to the thickness unevennesscorrection with the thickness unevenness correcting convex lens 17 andtherefore, just after the light converging position of the laser beam 12is moved from the recording layer 3 d to the recording layer 3 b (orfrom the recording layer 3 b to the recording layer 3 d), the focusingcondition is attained rapidly.

Because as evident from the expressions (12) to (14), in the thicknessunevenness correction control, its response speed is delayed 10 to 2times as compared to defocus correction, the thickness unevennesscorrection (spherical aberration correction) is insufficient just afterthe position in which the laser beam 12 is converged is moved from therecording layer 3 d to the recording layer 3 b. Therefore, the spot sizeof the ±first-order spot focused on each photo detecting cell 29 b and29 c of the second photo detector 29 for spherical aberration detectionis increased tremendously (brightness drops), so that the signalamplitude of a difference signal (FIG. 11C) for thickness unevennessdetection and the signal amplitude of a sum signal (FIG. 11D) decrease.Consequently, it is possible to detect such an abnormal jump between therecording layers that the light converging position of the laser beam 12changes from the recording layer 3 d to the recording layer 3 b suddenlydue to a disturbance according to the feature of the present inventionshown in the expressions (12) to (14).

That is, because the difference signal and sum signal for defocusdetection have the characteristics shown in FIGS. 11A and 11B, even ifthe position where the laser beam 12 is converged due to an abnormaljump between the recording layers changes, the sum signal level canmaintain the amplitude more than Lfc shown in FIG. 11B in the vicinityof the recording layer 3 b. Even if thickness unevenness (sphericalaberration) correction is carried out in the vicinity of the recordinglayer 3 d, the level of the sum signal (output signal of the adder 51 inFIG. 2) for thickness unevenness detection has a magnitude of Lth ormore as shown in FIG. 11D.

Therefore, if the light converging position of the laser beam 12 ismoved to the vicinity of the recording layer 3 b just after that, thethickness unevenness detection/correction control circuit system 114cannot follow up, so that the spots of the spherical aberrationdetecting laser beams 12 b and 12 c protrude largely from the sphericalaberration detecting cells 29 b and 29 c. As a result, the level of thesum signal (output signal of the adder 51 shown in FIG. 2) for thicknessunevenness detection drops below Lth (FIG. 11D), and therefore, it ispossible to obtain a detection signal 60 for abnormal jump between therecording layers by determining whether or not the level of the sumsignal for thickness unevenness detection is Lth or more with thecomparator 59 shown in FIG. 2.

Hereinafter, an application or a modification of the optical disk unitshown in FIG. 2 will be described with reference to FIGS. 12 to 16.Meanwhile, like reference numerals are attached to the same componentsas FIG. 2 (and FIG. 1) and a detailed description thereof is omitted.

Although the structure of the optical disk unit shown in FIG. 2 iscompared with the structure of the optical head unit and the informationrecording/reproducing apparatus using the same optical head unit shownin FIG. 1, it is needless to say that there exist the same relation inthe optical disk unit shown in FIG. 12.

The feature of an optical disk unit 210 shown in FIG. 12 is that thehologram device 26 used in the optical disk unit 10 described withreference to FIG. 2 is removed and a half mirror 201 is disposed betweenthe spherical lens 28 and the second photo detector 29 (optical diskunit 10 of FIG. 2). Further, because the reproduced laser beam 12′directed to the second photo detector 229 is split by using the halfmirror 201, a third photo detector 230 is added (about the photodetectors 229 and 230, both the optical system disposition and spotsfocused on the light receiving plane are indicated for convenience likeFIG. 2).

The second photo detector 229 and the third photo detector 230 areprovided at predetermined positions (substantially equal distances formthe center of the minimum circles of confusion) in front of and behindthe minimum circle of confusion formed when the reproduced laser beam12′ is converged based on convergence provided by the spherical lens 28.The distances from the center of the minimum circle of confusion to thesecond photo detector 229 and to the third photo detector 230 aredefined according to the expressions (7) and (8) described previously.

In the optical disk unit 210 shown in FIG. 12, an optical detecting cellnecessary for detecting the reproduced laser beam 12′ focused along theoptical axis of the spherical lens 28, a preamplifier for use inprocessing of the output thereof and an expensive hologram device can beomitted. In order to enable detection of an abnormal jump between therecording layers like the optical disk unit 10 shown in FIG. 2, areproduction signal attenuated to a predetermined level with theattenuator 58 by branching the output of an adder 91 of a reproductionsignal detecting system 113 is inputted to the comparator 59.

An optical disk unit 310 shown in FIG. 13 is an example using a knifeedge method in the defocus detecting system of the optical disk unit 10described with reference to FIG. 2.

In the optical disk unit 310 shown in FIG. 13, as evident from arefraction pattern capable of coping with the knife edge method, thatis, a schematic diagram in a plan view direction, a light shieldingportion 301 a which functions as a knife edge and a refraction pattern301 b (301 c) which generates the ±first-order spot are given to thehologram device 301 such that it is divided by a straight line includingthe center of the optical axis. As for the structure of the optical diskunit 310 shown in FIG. 13, the optical system defined by a portionhaving no pattern of the hologram device 310 (a boundary portion of thelight shielding portion 301 a, equivalent to a state having no hologramdevice 301), the spherical lens 28 and two photo detecting cells 329 aand 329 d in the center of a second photo detector 329 corresponds tothe defocusing detection system 111 in the optical head unit shown inFIG. 1 and the information recording/reproducing apparatus having theoptical head unit. Further, an optical system defined by the refractionpattern 301 b (301 c) of the hologram device 301, the spherical lens 28and remaining two photo detecting cells 329 b, 329 c of the second photodetector 329 corresponds to the thickness unevenness (sphericalaberration) detection system 114. Although part of the opticalcomponents are employed in common, the spherical aberration detectionsystem 114 and the defocusing detection system 111 are providedindependently.

The feature of the optical disk unit 310 shown in FIG. 13 is that thethickness unevenness detection/ correction control circuit system 114also serves as the correction control circuit system 111 by using onlythe single spherical lens 28 and the single photo detector 329 so as toreduce the size of the optical head unit thereby further reducing theweight thereof. Because the correction control circuit system 111 alsoserves as the thickness unevenness detection/correction control circuitsystem 114, the other piece of the reproduced laser beam 12′ divided bythe half prism 22 is employed to only detect a track shift and the firstphoto detector 325 is divided to two sections. Accompanied thereby, thequantity of pre-amplifiers for use in a signal processing circuit (trackshift detection/correction control circuit system 112) is reduced.

The optical disk unit 310 shown in FIG. 13 is so constructed to detect adefocus using half detection light 12 a extracted by dividing with astraight line including the vicinity of the optical axis center in whichdetection accuracy is stabilized most according to the knife edgemethod. Consequently, not only the accuracy of the defocus detection isimproved but also the highest detection reliability is secured.

An optical disk unit 410 shown in FIG. 14 employs the knife edge methodas a defocus detection method like the optical disk unit 310 shown inFIG. 13 and in this unit, by using a pattern similar to a sensitizingfilter for spherical aberration detection, which functions in the sameway as a sensitizing filter used in the optical disk unit 10 shown inFIG. 2 as a hologram pattern of a hologram device 401 for generating the±first-order spot, sensitizing processing is carried out.

The feature of the optical disk unit 410 shown in FIG. 14 is that thehologram device 401 includes three regions 401 a, 401 b and 401 c andincludes a blazed grating liked pattern covering the all of regions.Using only the laser beam 12 c passing through the region 401 c fordetecting a spherical aberration. Meanwhile, because the radius r of aborder between the region 401 b and the region 401 c is set up so as tosatisfy the expression (11), the sensitizing processing is attained todetect the spherical aberration and by detecting a sensitized signal,the spherical aberration is detected. A detection region of acorresponding photo detector 429 is divided to regions in which thezero-order light (center portion) is focused and regions 429 b and 429 cin which the ±first-order light (outer peripheral portion) is focused.Since, the hologram device 401 is blazed so as to attain the samefunction as a blazed grating (structure in which the refracted portionis inclined and which facilitates refraction in a specific direction),so that most of the refracted light is turned to the +first-orderrefracted light (so that light amount ratio of the −first-orderrefracted light is almost 0). Further, by shifting the center positionof refraction stripes, the pattern is optimized so that the center ofthe optical axis of the +first-order refracted light is irradiated on aborder line between the photo detecting cells 429 b and 429 c and aborder line between the photo detecting cells 429 a and 429 d.Meanwhile, a spot 12 b defined in an intermediate portion or between thecenter portion and the outer peripheral portion of the spot formed bythe laser beam 12 is not used in this example.

The optical disk unit 410 shown in FIG. 14 is so constructed to detect adefocus using half detection light 12 a extracted by dividing with astraight line including the vicinity of the optical axis in which thedetection accuracy is the highest and stabilized according to the knifeedge method like the optical disk unit 310 shown in FIG. 13. Thus, notonly the accuracy of the defocus detection is improved but also thehighest detection reliability is secured.

An optical disk unit 510 shown in FIG. 15 is an improvement of theoptical disk unit 410 shown in FIG. 14. A hologram device 501 includesfive regions, first to fifth, that is, regions 501 a, 501 b (inside),501 b (outside), 501 c and 501 d and includes a blazed grating likedpattern covering the all regions. The spherical aberration is detectedusing the laser beam 12 b passing the region 501 b and the laser beam 12c passing the region 501 c. The radius of a border between the region501 c and the region 501 a satisfies the expression (11) like theoptical disk unit shown in FIG. 14 or FIG. 13 so as to sensitize thespherical aberration.

Meanwhile, the detection region of a corresponding photo detector 529 isdivided to regions 529 a and 529 d in which the zero-order light (centerportion) is focused and regions 529 b and 529 c in which the±first-order light (outer peripheral portion) is focused. Anintermediate portion, that is, part of the spots 12 a and 12 d definedbetween the center portion and outer peripheral portion of a spot formedby the laser beam 12 is not employed in this example.

If the detection light characteristic in a range shown in the expression(10) is changed in the hologram device 501 (light amount is attenuatedor/and the phase is changed), the sensitivity of detecting the sphericalaberration drops as described above. Conversely, the optical disk unit510 shown in FIG. 15 makes a best use of this characteristic. That is,by combining the laser beam 12 c whose detection sensitivity isincreased on the photo detector 520 with the laser beam 12 b whosedetection sensitivity drops, sensitivity of detecting the sphericalaberration can be improved further.

Since, the hologram device 501 is blazed so as to attain the samefunction as a blazed grating (structure in which the refracted portionis inclined and which facilitates refraction in a specific direction),so that most of the refracted light is turned to the +first-orderrefracted light (so that light amount ratio of the −first-orderrefracted light is almost 0). Further, by shifting the center positionof refraction stripes, the pattern is optimized so that the center ofthe optical axis of the +first-order refracted light is irradiated on aborder line between the photo detecting cells 529 b and 529 c and aborder line between the photo detecting cells 529 a and 529 d.

In the optical disk unit 410 shown in FIG. 14 and the hologram devices401 and 501 for use in the optical disk unit 510, duty in the refractionpattern is set to be 50%. That is, the refraction pattern is designed sothat the zero-order refracted light component is 0 (light amount ratioof transmission light passing straight without being refracted is 0).

As described previously with reference to FIG. 7B, this employs the factthat if a portion from the center of the optical axis of the laser beam12 impinging upon the objective lens 19 up to the radius r is shielded(transmission light amount is attenuated or the phase is changed), themaximum position (minimum circle of confusion) of the center intensitywhen focusing is attained is shifted by ε.

Using the fact that when the position of ε is regarded as a lightemission point, light emitted from the ε is reflected by the recordinglayer 3 b or 3 d of the optical disk 3 and returned to the objectivelens 19 so that after that, it turns to convergent light, if thatconvergent light is irradiated into a detection light optical systemshown at the right of FIG. 8, a shift amount ξ of light converging pointin the vicinity of the second photo detector 29 becomes equal to a valueobtained by substituting for δ in the expression (1).

Therefore, if this convergent light is detected by a conventionaldefocus detecting optical system, a pseudo defocus detecting signal canbe obtained. If in the optical system model shown in FIG. 8, pseudospherical aberration is generated by the pseudo spherical aberrationgenerating/sensitizing filter function provided device 26 and a portionfrom the center of the optical axis of the laser beam 12 up to theradius r is shielded (or transmission light amount is attenuated or thephase is changed), the center intensity is maximized at a positions justbefore the recording layer 3 b or 3 d of the optical disk 3 (thisposition is regarded as a pseudo light emission point) although thefocusing is attained, so that the pseudo defocus signal is detected onthe second photo detector 29 after the detection optical system at theright of FIG. 8 is passed.

For the reason described above, if spherical aberration occurs due tothickness unevenness of the transparent protective layer (coveringlayer) 3 a of the optical disk 3, defocus correction is carried outaccurately using the first detection optical system (defocus detectingsystem) and a portion from the center of the optical axis up to theradius r is shielded by the second detection optical system (sphericalaberration detecting system) at the same time (or transmission lightamount is damped or the phase is changed). After that, if a signal isdetected with a conventional existing defocus detecting optical system,spherical aberration amount can be detected in the form of pseudodefocus detection signal. FIG. 16 shows an example in which thespherical detecting system is constructed by using that phenomenon.

An optical disk unit 610 shown in FIG. 16 employs a stigmatic methodknown as a general defocus detecting method for spherical aberrationdetection. That is, a hologram device 610 shown in FIG. 16 is divided totwo regions, first region 601 b and second region 601 c. By shifting thecenter of the refraction stripe of each region, the center of theoptical axis of the +first-order refracted light refracted by the region601 c is focused on a center portion surrounded by the fifth to eighthphoto detecting cells 625 e, 625 f, 625 g and 625 h of a photo detector625.

Meanwhile, because at least two regions 601 b and 601 c of the hologramdevice 601 are blazed so as to attain the same function as a blazedgrating like the hologram devices 501 and 401 described with referenceto FIGS. 15 and 14 (structure in which the refracted portion is inclinedso as to facilitate refraction in a specific direction), the+first-order refracted light intensity becomes much larger than the−first-order refracted light intensity. Therefore, the ratio of eachrefracted light intensity is 1:1:0:0:0 in the order of zero-orderrefracted light intensity, +first-order refracted light intensity,−first-order light intensity, +second-order light intensity,−second-order light intensity.

Meanwhile, the zero-order refracted light (straight transmission light)passing the center portion of the hologram device 601 passes thespherical lens 23 and the cylindrical lens 24 and is irradiated on photodetecting cells 625 a to 625 d of a photo detector 625 so as to detect adefocus amount according to defocus detection method widely calledastigmatic method. Then, the defocus correcting coil 20 is provided witha current with the defocus detection/correction control circuit system111 and then the position of the objective lens 19 is moved so as tocorrect the defocus.

The radius r of a border line (border circle) between the first region601 b and the second region 601 c of the hologram device 601 is set upso as to satisfy the expression (11) as described previously. Therefore,the +first-order refracted light refracted by the region 601 c of thehologram device 601 in a condition in which the focal point is made onthe recording layer 3 b or 3 d of the optical disk 3 is sensitized fordetecting the spherical aberration, so that in a model indicated in FIG.5, a light converging position shown in FIG. 7B is increased from δ toε. Its increase amount is further expanded on the detection opticalsystem as shown in the expression (1). The laser beam 12 c irradiated onthe photo detecting cells 625 e, 625 f, 625 g and 625 h generates apseudo defocus amount depending on a difference of a change from δ to εin terms of the position of spherical aberration (position of minimumcircle of confusion). As a result, the pattern of the laser beamirradiated on the photo detector 625 is changed from an angular shapehaving a completely circular shape to an elliptic ring shape as shown inFIG. 16 (photo detecting cells 625 e, 625 f, 625 g and 625 h) (asfocused on the photo detecting cells 625 a, 625 b, 625 c and 625 d).

After this pattern change is processed by the thickness unevennessdetection/correction control circuit system 114, it is converted to thethickness unevenness (spherical aberration) amount and then, by feedinga corresponding current to the thickness unevenness correcting convexlens driving coil 18, the thickness unevenness correcting convex lens 17is moved by a predetermined amount in a predetermined direction. As aresult, an influence by the spherical aberration generated by thicknessunevenness in the covering layer 3 a of the optical disk 3 can beremoved. It is needless to say that the optical disk unit 610 shown inFIG. 16 has the same structure as the optical head unit and theinformation recording/reproducing apparatus having the same optical headunit shown in FIG. 1. Meanwhile, although the spherical aberrationdetection system 114 also serves as the defocusing detection system 111,they can be regarded as optically independent system without any crosstalk because laser beam used in the spherical aberration detectionsystem 114 is completely separated from laser beam used in thedefocusing detection system 111.

Expressions (A-1) to (A-15) for use in dividing the regions of thehologram device for wavefront splitting using the hologram device 26 tobe incorporated in the optical disk unit 10 shown in FIG. 2 are shownbelow.

A1) Definition of Bessel's Function and Development of Bessel's Function

The Bessel's function is defined as follows $\begin{matrix}{{J_{v}\left( {2{\pi\rho}\quad r} \right)} \equiv {\sum\limits_{\xi = 0}^{\propto}{\frac{\left( {- 1} \right)^{\xi}}{{\xi!}{\left( {v + \xi} \right)!}}\left( {{\pi\rho}\quad r} \right)^{{{2\xi} + {v\quad 24}})}}}} & \left( {A\text{-}1} \right)\end{matrix}$

According to the expression (A-1), $\begin{matrix}{{{J_{0}\left( {2\pi\quad\rho\quad r} \right)} - {J_{2}\left( {2\pi\quad\rho\quad r} \right)}} = {1 + {\sum\limits_{\xi = 1}^{\propto}{\frac{\left( {- 1} \right)^{\xi}\left( {{2\xi} + 1} \right)}{{\xi!}{\left( {\xi + 1} \right)!}}\left( {\pi\quad\rho\quad r} \right)^{2\xi}}}}} & \left( {A\text{-}2} \right)\end{matrix}$is introduced.

Because the aforementioned Bessel's function has a characteristicJ _(−V)(2πρr)=(−1)^(V) J _(V)(2πρr)²⁴⁾   (A-3)(−i)^(−V) J _(−V)(2πρr)=(−i)^(V) J _(V)(2πρr)   (A-4)is obtained from the expression (A-3).

Therefore, $\begin{matrix}{{M_{mv}(\rho)} \equiv {2{\int_{0}^{1}{r^{m + 1}{J_{v}\left( {2{\pi\rho}\quad r} \right)}{\mathbb{d}r}}}}} & \left( {A\text{-}5} \right)\end{matrix}$is obtained.

If the expression (A-1) is substituted for the expression (A-5), theabove expression is changed to $\begin{matrix}{{M_{mv}(\rho)} = {\sum\limits_{\xi = 0}^{\propto}{\frac{2\left( {- 1} \right)^{\xi}}{\left( {{2\xi} + 2 + m + v} \right){\xi!}{\left( {\xi + v} \right)!}}({\pi\rho})^{{2\xi} + v}}}} & \left( {A\text{-}6} \right)\end{matrix}$

According to the expression (A-6), $\begin{matrix}{{{M_{mv}(0)} = {\frac{2}{m + 2}\left( {v = 0} \right)}},} & \left( {A\text{-}7} \right) \\{{{M_{mv}(0)} = {0\left( {v \neq 0} \right)}}{and}} & \left( {A\text{-}8} \right) \\\begin{matrix}{{N_{({2\mu})}(\rho)} \equiv {{M_{{({2\mu})}0}(\rho)} - {M_{{({2\mu})}2}(\rho)}}} \\{= {\frac{1}{\mu + 1} + {\sum\limits_{\xi = 1}^{\propto}{\frac{\left( {- 1} \right)^{\xi}\left( {{2\xi} + 1} \right)}{\left( {\xi + \mu + 1} \right){\xi!}{\left( {\xi + 1} \right)!}}\left( {\pi\quad\rho} \right)^{2\xi}}}}}\end{matrix} & \left( {A\text{-}9} \right)\end{matrix}$are obtained.

Meanwhile, the aforementioned g (r, φ) is Henkel-transformed,it comes that $\begin{matrix}{{{H\left\{ {g\left( {r,\phi} \right)} \right\}} = {\sum\limits_{n = {- \propto}}^{\propto}{{\left( {- i} \right)\quad}^{n}{\mathbb{e}}^{in}{\psi 2\pi}{\int_{0}^{\propto}{{{rg}_{n}(r)}{J_{n}\left( {2{\pi\rho}\quad r} \right)}\quad{\mathbb{d}r}}}}}},^{22)}} & \left( {A\text{-}10} \right) \\{{and}{{{g_{n}(r)} = {\frac{1}{2\pi}{\int_{0}^{2\pi}{{g\left( {r,\phi} \right)}{\mathbb{e}}^{{- {in}}\quad\phi}\quad{\mathbb{d}\phi}}}}},^{22)}{n\text{:}{integer}}}} & \left( {A\text{-}11} \right)\end{matrix}$

When g (r, φ) has the structure of $\begin{matrix}{{{g\left( {r,\phi} \right)} = {\sum\limits_{v}{{A_{v}(r)}{\cos\left( {v\quad\phi} \right)}}}},{v\text{:}{integer}}} & \left( {A\text{-}12} \right)\end{matrix}$the expression (A-10) turns to $\begin{matrix}\begin{matrix}{{H\left\{ {g\left( {r,\phi} \right)} \right\}} = {H\left\{ {\sum\limits_{v}{{A_{v}(r)}{\cos\left( {v\quad\phi} \right)}}} \right\}}} \\{= {2\pi{\sum\limits_{v}{\left( {- i} \right)^{v}{\cos\left( {v\quad\psi} \right)}{\int_{0}^{\propto}{{{rA}_{v}(r)}{J_{v}\left( {2{\pi\rho}\quad r} \right)}\quad{\mathbb{d}r}}}}}}}\end{matrix} & \left( {A\text{-}13} \right)\end{matrix}$

If the expression (A-12) is substituted for the expression (A-11) andthe expression (A-4) is used, the expression (A-13) is defined as$\begin{matrix}\begin{matrix}{{H\left\{ {g\left( {r,\phi} \right)} \right\} P_{{an}\quad 1}} = {H\left\{ {\sum\limits_{v}{{A_{v}(r)}{\cos\left( {v\quad\phi} \right)}}} \right\} P_{{an}\quad 1}}} \\{= {2\pi{\sum\limits_{v}{\left( {- i} \right)^{v}{\cos\left( {v\quad\psi} \right)}\left( {a - b} \right){{cA}_{v}(c)}{J_{v}\left( {2{\pi c}\quad\rho} \right)}}}}}\end{matrix} & \left( {A\text{-}14} \right) \\{{and}{c \equiv \frac{a + b}{2}}} & \left( {A\text{-}15} \right)\end{matrix}$under the condition of b<r<a and b≈a.

Further, the expression $\begin{matrix}{{{I(0)} \approx {\frac{1}{\sigma^{4} + \left( {\kappa\omega}_{20} \right)^{2}}\left\{ {{D^{2}\eta} + {4{\mathbb{e}}^{- {\sigma 2}}{{\sin^{2}\left( \frac{{\kappa\omega}_{20}}{2} \right)}\left\lbrack {1 - {\left( {1 - \eta} \right){DF}}} \right\rbrack}}} \right\}}},} & ({M10})\end{matrix}$is used to introduce the aforementioned expression (5).

In the optical disk unit shown in FIGS. 2, 12 to 16,

-   1) a method for correcting a thickness unevenness by the time when    information is reproduced or recording of information is started    after an information recording medium is loaded on the information    recording/reproducing apparatus, and startup of control of that    method,-   2) a method for correcting an influence of thickness unevenness by    the time when information is reproduced or recording of the    information is started just after a layer which light is converged    of the light reflecting layer or the recording layer is moved (the    layer is switched) with respect to a recording medium including    plural light reflecting layers or recording layers and startup of    control of that method, and-   3) a method for detecting a jump between layers (irregular shift    between layers) generated at random when information is reproduced    or information is recorded by converging light to any layer in an    information recording medium having plural light reflecting layers    or recording layers will be described in detail.

As described previously with reference to FIGS. 11A to 11F, the abnormaljump between layers will be described as a sum signal of the thicknessunevenness detection signal which is indicated on the vertical axis ofeach of, that is, output level of the adder.

FIGS. 17A to 17G are graphs indicating changes in a thickness unevennessdetection signal and a sum signal for detecting thickness unevenness incase where the defocus detection signal in the optical disk unit shownin FIG. 2 (FIGS. 12 to 16), and the thickness unevenness correctingconvex lens 17 are set up at different three positions as a pair of FIG.17B and FIG. 17C, a pair of FIG. 17D and FIG. 17E and a pair of FIG. 17Fand FIG. 17G. Meanwhile, in FIGS. 17A to 17G, a case where the defocuscorrection control is activated so that the objective lens 19 is focusedon the upper recording layer 3 d will be considered.

If as shown in FIGS. 17B and 17C, a remaining thickness unevennessamount (remaining error amount of spherical aberration) just after apredetermined voltage is applied to the thickness unevenness correctingcoil 18 is large in order to correct the position of the thicknessunevenness correcting convex lens 17 the level of the sum signal shownin FIG. 17C is Lth (a much smaller value (substantially “0”) than themagnitude defined previously in FIG. 11D or 11F). That is, it isdetected that the position of the thickness unevenness correcting convexlens 17 is far from the focusing position shown in FIG. 17A. If thevoltage applied to the thickness unevenness correcting convex lensdriving coil 18 is changed so that the position of the objective lens 19arrives at a position shown in FIG. 17D, the level of the sum signalbecomes substantially equal to Lth as shown in FIG. 17E. That is, it isevident that the remaining thickness unevenness (remaining error amountof spherical aberration) affecting the objective lens 19 by correctionwhich is a change of the position of the thickness unevenness correctingconvex lens 17 has been reduced much.

If the objective lens 19 reaches the focusing position (target position)shown in FIG. 17F, the level of the sum signal becomes about 1.5 timesto 2.5 times Lth (gain control is enabled) and the magnitude of thethickness unevenness detection signal substantially reaches a standardvalue.

However, in various optical disk units shown in FIG. 2 and FIGS. 12 to16, as described previously, in any case of

-   i) case where a large thickness unevenness occurs in the transparent    protective layer (covering layer) 3 a of the recording medium 3, and-   ii) case where dust or scratch occurs in the surface of the    transparent protective layer 3 a of the recording medium 3, the    level of the sum signal (for example, output signal of the adder 51    in FIG. 2) for detecting the thickness unevenness drops.

Therefore, it is necessary to identify which the sum signal fordetecting the thickness unevenness indicates i) occurrence of thethickness unevenness or ii) attachment of dust or occurrence of scratch.Meanwhile, because the thickness of the covering layer 3 a is 0.1 mm inmedian value, the thickness unevenness can be detected with allowance of±0.05 mm.

The characteristic or configuration of a photo detector capable ofspecifying any one of a change in the thickness unevenness of thecovering layer 3 a or a case where dust adheres to the covering layer 3a in the optical disk unit shown in FIG. 2 and FIGS. 12 to 16 orprocessing of output signal will be described.

First, if dust or scratch occurs in the surface of the transparentprotective layer 3 a of the information recording medium 3 in theoptical disk unit shown in FIG. 2, the output level drops. Therefore,even if a thickness unevenness of about ±0.05 mm occurs because thespecified thickness of the covering layer is 0.1 mm, it is possible todetect the thickness unevenness by extracting a detection signal capableof obtaining an output of a predetermined output signal level and thencomparing that detection signal with the sum signal (output signal levelof the adder 51) for detecting the thickness unevenness in terms of themagnitude.

The output signal level drops if dust or scratch occurs in the surfaceof the covering layer 3 a of the information recording medium 3. Even ifthe thickness of the covering layer changes in allowance of ±0.5 mm, theunit of FIG. 2 is capable of using an output signal outputted from thephoto detecting cell 29 a as a detection signal whose output signallevel does not drop.

The light receiving area of the photo detector 29 a is two or more timesa minimum size required for detecting an ordinary defocus. If nothickness unevenness occurs in the covering layer 3 a, when theobjective lens 19 is located at its focusing position, the size of alight spot focused on the photo detecting cell 29 a becomes apredetermined size (a design value for detecting the defocus). Bysetting so that a light spot twice or more larger than a design valuefor detecting the defocus is irradiated on the photo detecting cell 29 aif a thickness unevenness occurs in the covering layer 3 a, it ispossible to detect occurrence of thickness unevenness of the coveringlayer 3 a as well as the defocus. In other words, by making it possibleto detect all area (total light amount) of the light spot even if thearea of the light spot of the defocus signal changes to be twice or morelarger due to the thickness unevenness of the covering layer 3 a, adefocus amount of the objective lens 19 can be detected. Consequently, achange in the area of the light spot except when dust or scratch occursin the covering layer 3 a or thickness unevenness in the covering layer3 a can be detected.

In the optical disk unit shown in FIG. 12, the sum signal detected bythe photo detector 25 for use in detecting the defocus, track shift andreproduction signal is hardly affected by the thickness unevenness ofthe covering layer 3 a of the information recording medium 3. That is,because the spot size of the light spot 12 d of the laser beam 12′irradiated onto the photo detector 25 is not changed largely even if athickness unevenness occurs in the covering layer 3 a, the sum signal(for example, output signal of the adder 85) detected by the photodetector 25 is increased as compared to the other outputs. Thus, even ifa thickness unevenness (spherical aberration) occurs, little changeoccurs in the output level.

In the optical disk unit shown in FIG. 13, the sum signals (output of anadder 80) from photo detecting cells 239 a and 329 b for use indetecting the defocus are focused on the border line between the photodetecting cells 329 a and 329 b at the time of focusing of the objectivelens 19. Thus, the size of each of the photo detecting cells 329 a and329 b can be set up to be larger than the spot 12 a.

Therefore, if a thickness unevenness occurs, the spot 12 a neverprotrudes out of the photo detecting cells 329 a and 329 b.

In the optical disk unit shown in FIG. 14, when the sum signals (outputof the adder 80) from the photo detecting cells 429 a and 429 b for usein detecting the defocus are provided, the spot 12 a never protrudes outof the photo detecting cells 429 a and 429 b even if the thicknessunevenness occurs in the same manner as the example shown in FIG. 13.

That is, even if the thickness of the covering layer changes in theallowance of ±0.5 mm in the optical disk unit shown in FIGS. 12 to 14,the output levels (output of the adder 51) of the aforementioned signaland a sum signal for detecting the thickness unevenness drop as adetection signal whose output level does not drop and consequently, theoutput of the comparator 59 is not changed so that the abnormal jumpdetection signal 60 is not generated.

In a condition in which the light spot of laser beam for recording orreproduction is converged on the upper recording layer 3 d (in acondition before an abnormal jump between the recording layers in thelight spot is generated), most of the laser beam spot (12 b and 12 c inFIG. 2, 12 b and 12 c in FIG. 12, 12 b and 12 c in FIG. 13 or 12 c inFIG. 14) for detecting the thickness unevenness is converged in an areaof the optical cell (29 b and 29 c in FIG. 2, 229 and 230 in FIG. 12,329 c and 329 d in FIG. 13, and 429 c and 429 d in FIG. 14),respectively. Thus, as shown at the right of FIG. 11D, output voltage ofthe comparator 59 exceeds the level of its predetermined value Lth. Ifthe light converging spot of laser beam for recording or reproduction ismoved instantaneously from the upper recording layer 3 d to the lowerrecording layer 3 b, the defocus correction control is activated so thatthe focusing condition is attained, just after the light converging spotis moved to the lower recording layer 3 b, because the frequencycharacteristic (cut-off frequency Fcf) of the defocus correction controlcircuit system 111 is sufficiently high (sufficiently fast), asdescribed with reference to FIG. 11B.

However, as described with reference to FIGS. 11C, 11D, 11E and 11F,because the frequency characteristic (cut-off frequency Fct) of thethickness unevenness correction control circuit system 114 is very low(slow), the thickness unevenness correction is delayed several times tohundred times as compared to the defocus correction. Therefore, acondition in which a large thickness unevenness arises continues for arelatively long period.

In this case, the spots (12 b and 12 c in FIG. 2, 12 b and 12 c in FIG.12, 12 b and 12 c in FIG. 13 or 12 c in FIG. 14) of laser beam fordetecting the thickness unevenness are irradiated on a correspondingphoto detecting cell such that they protrude largely from the photodetecting cells for detecting the thickness unevenness (29 b and 29 c inFIG. 2, 229 and 230 in FIG. 12, 329 c and 329 d in FIG. 13 and 429 c and429 d in FIG. 14), respectively. Thus, the output of the adder 51 (ex.FIG. 2) which is the sum signal of the thickness unevenness detectionsignal drops largely.

Consequently, the output level of the comparator 59 in each optical diskunit becomes lower than the predetermined value Lth as shown in FIG.11D. By detecting a drop of the output level of the comparator 59 tobelow the predetermined level Lth, the signal 60 for detecting abnormaljump between the recording layers is obtained.

Hereinafter, an example of the correction control operation in which thesum signal indicated in each of FIG. 11D, FIG. 11F, FIG. 17C, FIG. 17Eand FIG. 17G obtained as a result of detecting the thickness unevennessin order to remove an influence generated when dust is attached orscratch is generated in the transparent protective layer 3 a of therecording medium 3 is replaced with output signal of the comparator 59so as to enable “start of thickness unevenness correction”, “terminationof thickness unevenness correction control” and “detection of abnormaljump between recording layers” while the defocus correction control isbeing executed (focus servo loop ON), will be described below.

FIG. 17A shows a defocus detecting signal and each pair of FIGS. 17B,17C, FIGS. 17D, 17E and FIGS. 17F, 17G indicate changes in the output ofthickness unevenness detecting signal (output signal of the subtractor50) and a sum signal for detecting the thickness unevenness (outputsignal of the adder 51) by changing the output voltage from the drivingvoltage generating portion 56 with the switch 54 in the thicknessunevenness detection/correction control circuit system 114 turned OFF.Meanwhile, the horizontal axis in each graph indicates a defocus amountof the objective lens 19 or a defocus detecting signal with respect to arelative position of the objective lens 19. Further, a case where theobjective lens 19 is focused on the upper recording layer 3 d of therecording medium 3 as a result of the defocus correction control asshown in FIG. 17A will be considered.

From each pair of FIGS. 17B and 17C, FIGS. 17D and 17E and FIGS. 7F and17G, it is recognized that if a remaining thickness unevenness aftercorrection based on an output voltage value of the driving voltagegenerating portion 56 is large, the level of the sum signal (outputsignal from the comparator 59) is much smaller than the predeterminedvalue Lth as shown in FIGS. 17B and 17C.

On the other hand, if the output voltage of the driving voltagegenerating portion 56 is changed so that the lens is moved to a positionshown in FIG. 17D, that is, a focusing position of the upper recordinglayer 3 d, the level of the sum signal (output signal of the comparator59) becomes larger than the predetermined value Lth as shown in FIG.17E. That is, it is made evident that the size of the remainingthickness unevenness (remaining error of spherical aberration) remainingafter correction of the thickness unevenness is suppressed.

Further, if the output voltage of the driving voltage generating portion56 is changed, it is recognized that the level of the sum signal (outputsignal from the comparator 59) is increased up to about double thepredetermined value at a focusing position of the upper recording layer3 d as shown in FIGS. 17F and 17G.

FIGS. 18A and 18B is a schematic diagram (flow chart) for explaining anexample of a method capable of extracting a start timing of thicknessunevenness detection/correction control by searching a condition havinga small thickness unevenness using a sum signal (output of thecomparator 59) of the thickness unevenness signal as an applicationexample other than an abnormal jump of the light converging spot betweenthe recording layers.

First, the information recording medium 3 is loaded on an informationrecording/reproducing apparatus (or information reproducing apparatus)of any type described with reference to FIG. 2 or FIGS. 12 to 16 (ST01).

Subsequently, a spindle motor (not shown) is rotated so that theinformation recording medium 3 is rotated at a predetermined speed(ST02).

Next, process for searching an optimum position for thickness unevennesscorrection is executed. Ahead of this process, the position of thethickness unevenness correcting convex lens 17 is moved to a temporaryneutral position. In case where the thickness unevenness correctingconvex lens 17 is disposed at a predetermined position of a fixingsystem through a slider member (not shown) or the like, if the switch 54in the thickness unevenness detection/correction control circuit system114 is turned off or the output voltage of the driving voltagegenerating portion 56 is set to a reference voltage so that no currentflows to the thickness unevenness correcting convex lens driving coil18, the thickness unevenness correcting convex lens 17 is located at aneutral position due to activity of a spring.

If the thickness unevenness correcting convex lens 17 is so constructedto include no spring member, such that it is located at a predeterminedposition relative to a fixing position through a sliding mechanism (notshown), a position sensor using optical principle or using aelectrostatic capacity principle is disposed and the neutral position ofthe thickness unevenness correcting convex lens 17 is determined at aposition where the output of this position sensor becomes a referencevoltage. Further, a correction amount of the spherical aberration in thevicinity of the neutral position of the thickness unevenness correctingconvex lens 17 is substantially “0”. Because when the thickness of thetransparent protective layer 3 a is ideal with respect to an informationrecording medium having a single recording layer, spherical aberrationcorrection (thickness unevenness correction) is hardly necessary, thevicinity of a neutral position of the thickness unevenness correctingconvex lens 17 corresponds to an optimum position for thicknessunevenness correction. Further, because even in an information recordingmedium corresponding to an information reproducing(recording/reproducing) apparatus employing an objective lens of a highNA, an average value between a distance from the surface of thetransparent protective layer 3 a to the lower recording layer 3 b and adistance from the surface of the transparent protective layer 3 a to theupper recording layer 3 d requires the spherical aberration correctionamount of substantially “0”, if there are plural recording layerscapable of reproducing or recording from a single side, an optimumposition for thickness unevenness correction in the center of the upperrecording layer 3 d and the lower recording layer 3 b is located in thevicinity of the “neutral position” of the thickness unevennesscorrecting convex lens 17. Meanwhile, by locating the thicknessunevenness correcting convex lens at the “neutral position” or in thevicinity thereof, time required for searching for the vicinity of theoptimum position for thickness unevenness correction can be reduced.

More detail, current of a predetermined magnitude is supplied to thethickness unevenness correcting driving coil 18, so that the thicknessunevenness correcting convex lens 17 is moved slowly. Then, by themovement of this thickness unevenness correcting convex lens, a positionin which the thickness unevenness amount (remaining error amount ofspherical aberration) is minimized (small) is obtained (detected).Actually, current of a predetermined magnitude and polarity is suppliedso as to move the thickness unevenness correcting convex lens 17 to aposition optimizing spherical aberration correction when a lightconverging spot which is focused by the objective lens 19 is locatedsubstantially in the center between the upper recording layer 3 d andthe lower recording layer 3 b of the recording medium 3 (ST03).

In step ST03, when defocus correction control is started (when theswitch 84 of the defocus detection/correction control circuit system 111is connected), the thickness unevenness correcting convex lens 17 islocated at the neutral position as initial setting.

That is, because the thickness unevenness correction control system 102is located at the neutral position in its initial condition, which arecording layer which the objective lens 19 is focused on is the upperrecording layer 3 d or the lower recording layer 3 b can bedistinguished.

Next, in order to protect the recording layer 3 b or the recording layer3 d from erroneous recording of unnecessary information prior to startof the defocus correction control, the optical head unit is moved to aspecific position like an innermost peripheral position on theinformation recording medium 3 (ST04).

By supplying a predetermined driving current from a light emissioncontrol portion (laser driving circuit) (not shown) subsequently, laserbeam 12 of a predetermined wavelength is emitted from the semiconductorlaser device 11 (ST05).

When the defocus correction control is started (focus servo loop isturned ON) so that the switch 84 of the defocus detection/correctioncontrol circuit system 111 is cut off, a sweep voltage whose outputvoltage changes gradually is supplied from the driving voltagegenerating portion 86 to the objective lens driving coil (defocuscorrecting coil) 20, so that the objective lens 19 is moved slowly. Moredetail, the objective lens 19 is moved to a position farthest from theinformation recording medium 3 in a while and then, the objective lens19 is approached to the information recording medium 3 gradually. Thatis, sum signal output level of defocus detection signal outputted fromthe defocus detecting photo detector (25 in FIG. 2, 25 in FIG. 12, 329 aand 329 b in FIG. 13, 429 a and 429 b in FIG. 14, 529 a and 529 d inFIG. 15), respectively, becomes higher than Lfc in the vicinity of afocusing position in the upper recording layer 3 d or the lowerrecording layer 3 b as described with reference to FIGS. 11A to 11F.Therefore, the level of the sum signal is detected so as to detect thefocusing position. At a position where the output of the subtractor 81,which is the defocus detection signal, reaches a reference voltage (seeFIG. 11A), the switch 84 is connected so as to start the defocuscorrection control (ST06).

Next, by changing the output voltage of the driving voltage generatingportion 56 gradually, the thickness unevenness correcting convex lens 17is moved in the direction of decreasing the remaining thicknessunevenness correction amount (remaining spherical aberration amount)with respect to a recording layer which the objective lens 19 is focused(ST07).

The above-described step ST07 is continued until the output level of thecomparator 59 exceeds a predetermined value Lth (ST08).

Next, the thickness unevenness correction control is started (thicknessservo loop is turned ON). Specifically, because in step ST08, theobjective lens 19 is located at substantially the focusing position whenthe thickness unevenness detection signal (output signal of thesubtractor 50) substantially reaches the reference voltage (because thethickness unevenness correcting convex lens 17 is located at a temporaryneutral position), the remaining thickness unevenness (remaining erroramount of spherical aberration) after the correction is substantially“0”. With this condition, the switch 54 of the thickness unevennessdetection/correction control circuit system 114 is turned ON so as toactivate the thickness unevenness correction control system 114 (ST09).

Subsequently, track shift correction control is started (track servoloop is turned ON). That is, the switch (not shown) in the track shiftdetection/correction control circuit system 112 is connected so as toactivate the track shift correction control system 104 and informationis reproduced from the information recording medium 3 (ST10).

In step ST10, whether or not information in a target information layer(3 a or 3 b) is reproduced is determined (ST11). In detail, in stepST11, pre-address information (not shown) in the information recordingmedium 3 is reproduced and whether or not information in the targetrecording layer 3 b or 3 d is reproduced is recognized. If informationin the target recording layer is not reproduced (ST11—NO), defocuscorrection and thickness unevenness correction to the objective lens 19are repeated (ST06 to ST10).

If in step ST11, information in the target recording layer is reproduced(ST11—YES), a current position is recognized using pre-pit addressinformation so as to carry out rough access for moving the optical headentirely or dense access for moving only the objective lens is carriedout and then, when a reproduction or recording start position isreached, recording processing or reproduction processing is started(ST13).

During continuous recording or continuous reproduction, an abnormal jumpof a light converging spot between recording layers, which may beoriginated from disturbance or the like, is detected using a methoddescribed below with reference to FIG. 20 and if necessary, the lightconverging spot is returned to a target track.

FIGS. 19A and 19B is a schematic diagram (flow chart) for explaining aprocessing method for recording information across plural recordinglayers 3 b and 3 d from a side of the information recording medium 3 andfor reproducing the same information, which is a modification of themethod for extracting a start timing of thickness unevennessdetection/correction control by detecting a status having a smallthickness unevenness amount using the sum signal of the thicknessunevenness detecting signal described with reference to FIGS. 18A and18B. In this case, all controls (servo loop) for “defocus correctioncontrol”, “thickness unevenness correction control” and “track shiftcorrection control” are turned off in a while and the objective lens 19is moved to other recording layers 3 b and 3 d. After that, all thecontrols for the “defocus correction control”, “thickness unevennesscorrection control” and “track shift correction control” are restored(servo loop is turned ON).

First, a host computer (not shown) specifies a range of information tobe recorded or reproduced on the information recording medium 3 (ST21).

In step S21, information is recorded in a range specified in step S21(ST22).

Next, termination of recording or reproduction in a recording layer isdetermined (ST23) and if the recording or reproduction is notterminated, current reproduction or recording is maintained until it isterminated (ST23—NO).

If recording or reproduction is terminated (ST23—YES), first, trackshift correction control is terminated (track servo loop is turned off)(ST24) so as to terminate thickness unevenness correction control(thickness servo loop is turned off). That is, the switch 54 is turnedoff (ST25). Meanwhile, in step ST25, output (voltage value) of thedriving voltage generating portion 56 just before the switch 84 isturned off is maintained by a memory (not shown) or a voltage holdingcircuit (not shown).

Subsequently, the switch 84 is turned off so as to terminate the defocuscorrection control (focus servo loop is turned off). Output of thedriving voltage generating portion 56 is held by a memory or a voltageholding circuit (not shown). Further, a pulse for moving the objectivelens 19 is generated from the driving voltage generating portion 82 justafter so as to move a layer on which laser beam is converged by theobjective lens 19 to another recording layer (ST26).

Next, the defocus correction control is started (focus servo loop isturned on). More detail, when a total value of detection signalsoutputted from the adder 85 exceeds a predetermined value Lfc whileoutput value of the subtractor 81 reaches a reference value, the switch84 is turned on and the servo loop of the defocus detection/correctioncircuit system 111 is turned on (ST27).

Subsequently, corresponding to a recording layer (3 d or 3 b) in whichdefocus correction is being carried out currently, the output of thedriving voltage generating portion 56 of the thickness unevennesscorrecting circuit is changed gradually (ST28).

Next, the above-described step ST28 is held until the output level ofthe comparator 59 exceeds a predetermined value Lth (ST29). When theoutput of the comparator 59 exceeds the predetermined value Lth and theoutput of the subtractor 50 reaches the reference voltage, the switch 54is turned on so that the thickness unevenness correcting system 102 isactivated. That is, the thickness unevenness correction control isstarted (thickness servo loop is turned on) (ST30).

Then, the track shift correction control is started (track servo loop isturned on) or the track shift correcting system 104 is activated so asto reproduce information from the information recording medium 3 (ST31).

Next, pre-address information (not shown) in the information recordingmedium 3 is reproduced and whether or not information in a targetrecording layer 3 b or 3 d is reproduced is determined (ST32).

Unless information in the target recording layer is reproduced(ST32—NO), the sequential process from step ST24 is repeated (ST24 toST32).

If in step ST32, information in the target recording layer is reproduced(ST32—YES), servo loops of the defocus detection/correction controlsystem 111 and the thickness unevenness detecting/correcting system areturned on and a light converging spot converged by the objective lens 19is moved, and then, the rough access or the dense access of moving onlythe objective lens is carried out (ST33).

In step ST33, whether or not reproduction of a target or arrival at arecording start position is attained is determined (ST34) and after thetarget position is reached (ST34—YES), the recording processing orreproduction processing is started (ST35).

Needless to say, if the light converging spot by the objective lens 19does not reach the target position in step ST34, the step ST33 isrepeated.

When the thickness unevenness correction control is interrupted bycutting off the switch 54 of the thickness unevennessdetection/correction control circuit system 114 in step ST25, by holdingthe output of the driving voltage generating portion 56 at a voltagevalue just before the interruption, time required until the thicknessunevenness correction control is stabilized can be reduced like in stepsdescribed with reference to FIG. 20, when the thickness unevennesscorrection control is restarted. Further, by generating a pulse formoving the objective lens 19 from the driving voltage generating portion86 after all controls (servo loops) for “defocus correction control”,“thickness unevenness correction control” and “track shift correctioncontrol” are cut off, in order to move the objective lens 19 to otherrecording layers 3 b and 3 d, a recording layer relating to therecording or reproduction can be changed easily. Meanwhile, after theobjective recording layer is changed, the all controls for “defocuscorrection control”, “thickness unevenness correction control” and“track shift correction control” may be restored in the order of thesteps described with reference to FIGS. 18A and 18B.

FIG. 20 is a schematic diagram (flow chart) for explaining a process fordetecting an abnormal jump between the recording layers.

In steps shown in FIG. 20, the track shift detection/correction controlcircuit system 112 is activated (track servo loop is turned on) and withthe defocus detection/correction control circuit system 111 activated(focus servo loop on), a change in the level of the sum signal (outputof the adder 51) of the thickness unevenness detection signal isdetected so as to detect an abnormal jump of the light converging spotbetween the recording layers.

Although not shown, address information indicating a detailed positionon the information recording medium 3 is recorded in each of therecording layers 3 b and 3 d of the information recording medium 3 asfor example, a pre-address.

As for the style of this pre-address,

-   1) recording layer information (identification information for    identifying the upper recording layer 3 d or the lower recording    layer 3 b) is recorded in the pre-address information, or-   2) the pre-address information is set up in sequence number across    the respective recording layers 3 b and 3 d.

It is necessary to distinguish which a recording layer whose informationis reproduced according to the pre-address information is the upperrecording layer 3 d or the lower recording layer 3 b immediately.Because this information is recorded preliminarily, which of therecording layers a currently reproduced recording layer can bedistinguished by reproducing the pre-address information.

More specifically, during reproduction or recording of information inthe specific recording layer 3 b or 3 d on the information recordingmedium 3 (ST41), whether or not the sum signal of the thicknessunevenness detection signal or the output of the comparator 57 exceedsthe predetermined value Lth is determined (ST42). If no reproductionsignal from a scheduled recording layer is obtained (ST43—NO), it isdetermined that the objective lens 19 is moved unexpectedly due to aninfluence of disturbance or the like so that an abnormal jump of thelight converging spot between the recording layers occurs (ST44) andthen the servo of the track shift detecting/correcting system 112 isturned off (ST45).

Next, the switch 54 of the thickness unevenness detecting/correctingcircuit system 114 is turned off so as to interrupt the thicknessunevenness correction and at the same time, a voltage just before theinterruption of the driving voltage generating portion 56 is maintainedwith a memory or a voltage holding circuit (not shown) (ST46). At thistime, the thickness unevenness detection/correction control circuitsystem 114 holds the output of the driving voltage generating portion 56at a voltage just before the interruption in order to prevent anabnormal movement of the thickness unevenness correcting convex lens 17due to run-away of the thickness unevenness detection/correction controlcircuit system 114. Further, this run-away preventive processing makesit possible to reduce time required to stabilize the operation of thethickness unevenness detection/correction control circuit system 114.

Subsequently, by turning off the switch 84 of the thickness unevennessdetecting/correcting circuit system 111, the defocus control isinterrupted (ST47).

Hereinafter, the ST13 is continued from the steps ST06 described withreference to FIGS. 18A and 18B (ST48)

Although not shown, the condition of reproduction or recording ofinformation in the specific recording layer 3 b or 3 d on theinformation recording medium 3 in step ST41 means that

-   a) the defocus detection/correction control is being carried out    (focus servo loop is on),-   b) the thickness unevenness detection/correction control is being    carried out (thickness servo loop is on), and-   c) track shift detection/correction is being carried out (track    servo loop is on).

During continuous reproduction or continuous recording, the output ofthe comparator 59 is monitored every predetermined interval. If it islower than a predetermined value Lth or the output of the comparator 59exceeds the predetermined value Lth, the pre-address signal recordedpreliminarily in each recording layer 3 b, 3 d is detected with thereproduction processing circuit 92 of the optical disk unit shown inFIG. 2 or FIGS. 12 to 16 in order to monitor whether or not reproductionor recording is attained in the scheduled recording layers 3 b and 3 d.If it is detected that an unexpected recording layer 3 b is traced, anabnormal jump between recording layers is dispatched. Meanwhile, in theexample shown in FIG. 20, detection of the abnormal jump using athickness unevenness detection signal (ST42) and detection of theabnormal jump using a reproduction signal from the pre-address (ST43)are employed at the same time in order to intensify the reliability.

As described above, in the optical disk unit having the thicknessunevenness detecting optical system shown in FIG. 2 or FIGS. 12 to 16,respectively, its thickness unevenness detection/correction range(dynamic range) is relatively small so that the thickness unevennessdetection/correction control cannot be started from an arbitraryposition. However, by moving the thickness unevenness correcting convexlens 17 slowly in the focusing condition so as to change thicknessunevenness (spherical aberration) correction amount, monitoring a sumsignal of the thickness unevenness signal so as to detect a positionhaving a small thickness unevenness amount (spherical aberration afterthe correction) after the correction and starting the thicknessunevenness correction control (thickness servo loop is turned on) withthat condition, start timing of the thickness unevennessdetection/correction control can be extracted without providing theoptical disk unit with any new detecting circuit or detecting system.

By searching for a condition having a small thickness unevenness usingthe sum signal (output of the comparator 59) of the thickness unevennessdetection signal and extracting a start timing for thickness unevennessdetection/correction control, information can be recorded across pluralrecording layers 3 b and 3 d from a single side of the informationrecording medium 3 or can be reproduced.

Further, according to the present invention, by detecting a movingdistance δ of the minimum circle of confusion and its direction, aspherical aberration generated accompanied by a change in the thicknessof the transparent protective layer 3 a or spherical aberration amountgenerated when the spot section (light converging spot) of the laserbeam 12 is moved between the recording layers 3 b and 3 d is detectedrapidly. That is, the feature of the present invention is that theamount and direction of the spherical aberration are detected by using ashift of the minimum circle of confusion (position in which the centerintensity is maximized) in the optical axis direction generated when thespherical aberration occurs.

The thickness unevenness correction method of the present invention usesthe fact that only when the objective lens is focused, the thicknessunevenness detection signal can be obtained at a high precision. If itis intended to start the thickness unevenness correction control with acondition before the defocus correction control is carried out, thethickness unevenness correction control is started based on an erroneousthickness unevenness detection signal, so that the thickness unevennesscan be corrected stably at a high precision.

If upon thickness unevenness correction control (thickness servo loop isturned on), the light converging spot is moved from a currently focusedrecording layer to another recording layer unreasonably, the abnormalthickness unevenness correction control is activated so that thicknessunevenness correction control runs away. Thus, by terminating thethickness unevenness correction control temporarily before the lightconverging position is moved between recording layers, the run-away ofthe thickness unevenness correction control can be controlled and at thesame time, time required until thickness correction control is restarted(thickness servo loop is turned on) just after the light convergingposition is moved can be reduced. By using the thickness unevennessdetection signal, the abnormal jump detection signal can be obtained ata high precision, so that the necessity of detecting the abnormal jumpbetween recording layers with a defocus detecting optical system iseliminated. As a result, freedom of the optical design is increased, sothat a high precision defocus detecting optical system can beestablished.

As described above, according to the optical disk unit of the presentinvention, even if a thickness unevenness is generated in transparentresin layer located on the side of the objective lens of the opticaldisk unit of the present invention, information can be recorded at ahigh recording density by removing an influence of spherical aberrationor distortion of converging light.

Further, according to the present invention, by detecting a positionlittle affected by the spherical aberration by referring to a sum of thethickness unevenness detection signal and starting the thicknessunevenness correction control with that condition, thickness unevennessdetection/correction control startup timing can be extracted withoutproviding an optical disk unit having a relatively small thicknessunevenness detection/correction range (dynamic range) with any newdetecting circuit and/or a detecting system.

The present invention is not limited to the embodiments described aboveand can be modified in various manners without departing from the spiritand scope of the invention.

For example, the present invention can provide a method for compensatingfor an influence of thickness unevenness in a recording mediumincluding: an objective lens for focusing light from a light source to arecording layer of a recording medium; a defocus detecting system fordetecting a defocus generated when light converged to the recordingmedium by said objective lens is not focused at a predeterminedposition; a thickness unevenness detecting system for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

controlling for at least one of said defocus correcting mechanism andsaid thickness unevenness correcting mechanism to approach apredetermined objective value based on at least one of a defocus amountdetected by said defocus detecting system and a thickness unevennessamount (degree of spherical aberration) detected by said thicknessunevenness detecting system.

The present invention can also provide to a method for compensating foran influence of thickness unevenness in a recording medium including: anobjective lens for focusing light from a light source to a recordinglayer of a recording medium; a defocus detecting system for detecting adefocus generated when light converged to the recording medium by saidobjective lens is not focused at a predetermined position; a thicknessunevenness detecting system for detecting a thickness unevenness(spherical aberration) in a transparent resin layer of the recordingmedium provided nearest said objective lens; a thickness unevennesscorrecting mechanism for changing focusing characteristic of lightimpinging upon said objective lens from a light source based on a changein thickness of the transparent resin layer of the recording mediumdetected by the thickness unevenness detecting system; and a defocuscorrecting mechanism for correcting a defocus detected by said defocusdetecting system, said method comprising:

when controlling for at least one of said defocus correcting mechanismand said thickness unevenness correcting mechanism to approach apredetermined objective value based on at least one of a defocus amountdetected by said defocus detecting system and a thickness unevennessamount detected by said thickness unevenness detecting system,

controlling so that said thickness unevenness amount approaches saidobject value by means of said thickness unevenness correcting mechanismwhile said defocus amount is being controlled to be brought near theobject value by means of said defocus correcting mechanism.

The present invention can further provide a method for compensating foran influence of thickness unevenness in a recording medium including: anobjective lens for focusing light from a light source to a recordinglayer of a recording medium; a defocus detecting system for detecting adefocus generated when light converged to the recording medium by saidobjective lens is not focused at a predetermined position; a thicknessunevenness detecting system for detecting a thickness unevenness(spherical aberration) in a transparent resin layer of the recordingmedium provided nearest said objective lens; a thickness unevennesscorrecting mechanism for changing focusing characteristic of lightimpinging upon said objective lens from a light source based on a changein thickness of the transparent resin layer of the recording mediumdetected by the thickness unevenness detecting system; and a defocuscorrecting mechanism for correcting a defocus detected by said defocusdetecting system, said method comprising:

detecting an abnormal jump (erroneous motion of the objective lens) inwhich although said objective lens is controlled so as to be focused onany recording layer in a recording medium, said objective lens is movedundesirably so as to focus on a different recording layer,

said abnormal jump being detected by referring to a sum of signalsoutputted form each photo detecting region of said thickness unevennessdetecting system while said objective lens is controlled in terms ofposition by means of said defocus correcting mechanism so as to approacha predetermined position.

Still further, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

while [in a range in which] the position of said objective lens iscontrolled so as to approach a predetermined position by means of saiddefocus correcting mechanism, the sum of signals outputted from eachphoto detecting region of said thickness unevenness detecting system isreferred to so that the thickness correction control by said thicknessunevenness correcting mechanism is started.

Further another, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource a predetermined position of any one of a guide groove or arecording mark string provided in any recording layer in a recordingmedium having two or more recording layers; a defocus detecting systemfor detecting a defocus generated when light converged to the recordingmedium by said objective lens is not focused at a predeterminedposition; a track shift detecting system for detecting a track shiftgenerated when said objective lens is not focused at a predeterminedposition of any one of the guide groove or the recording mark; athickness unevenness detecting system for detecting a thicknessunevenness (spherical aberration) of transparent resin layer in therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; a defocuscorrecting mechanism for correcting a defocus detected by said defocusdetecting system; and a track shift correcting mechanism for correctinga track shift detected by said track shift detecting system, said methodcomprising:

when changing the recording layer on which said light is focused on froma status in which said light is focused on any recording layer in therecording medium with said objective lens to another recording layer,stopping correction of said track shift with said track shift correctingmechanism and stopping changing of the focusing characteristic of lightimpinging upon the objective lens through said thickness unevennesscorrecting mechanism.

Still further, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting system fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest said objectivelens; a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

detecting a thickness unevenness of the recording layer with saidthickness unevenness detecting system in a condition in which thedefocus amount outputted from said defocus detecting system ismaximized.

Further another, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem including a detecting system provided with at least two differentdetection characteristics and for detecting a defocus generated whenlight converged to the recording medium by said objective lens is notfocused at a predetermined position; a thickness unevenness detectingsystem for detecting a thickness unevenness (spherical aberration) in atransparent resin layer of the recording medium provided nearest saidobjective lens; a thickness unevenness correcting mechanism for changingfocusing characteristic of light impinging upon said objective lens froma light source based on a change in thickness of the transparent resinlayer of the recording medium detected by the thickness unevennessdetecting system; and a defocus correcting mechanism for correcting adefocus detected by said defocus detecting system, wherein

said thickness unevenness detecting system detects a thicknessunevenness of the recording layer using a detection signal outputtedfrom a detecting system of said defocus detecting system.

Still further, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting system fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest said objectivelens; a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, wherein

said thickness unevenness detecting system includes an optical devicefor changing the optical characteristic of light section and provides adetection sensitivity defined thereby.

Further another, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting system fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest said objectivelens; a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, wherein

said thickness unevenness detecting system includes an optical deviceincludes at least one of a filter or an apodizer for changing theoptical characteristic of light section and provides a detectionsensitivity defined thereby.

Still further, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting system fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest said objectivelens; a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, wherein

the band of a servo signal for said defocus correction control isdifferent from a band of a servo signal for said thickness unevennesscorrection control.

Further another, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium including: an objective lens for focusing light from a lightsource to a recording layer of a recording medium; a defocus detectingsystem for detecting a defocus generated when light converged to therecording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting system fordetecting a thickness unevenness (spherical aberration) in a transparentresin layer of the recording medium provided nearest said objectivelens; a thickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, wherein

the band of a servo signal for said defocus correction control isdifferent from a band of a servo signal for said thickness unevennesscorrection control and the band of said servo signal corresponding to aresponse frequency of said thickness unevenness correcting mechanism islower than the band of said servo signal corresponding to a responsefrequency of said defocus correcting mechanism.

Still further, the present invention can provide an optical head unitcomprising:

a light source for supplying light of a predetermined wavelength;

an objective lens for focusing light from said light source to therecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system for detecting a thicknessunevenness in a transparent resin layer of the recording medium providednearest said objective lens; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system.

Further another, the present invention can provide an optical head unitcomprising:

a light source for supplying light of a predetermined wavelength;

an objective lens for focusing light from said light source to therecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system, includes an optical devicewhich, when the radius of a spot section of light which is a detectionobject is assumed to be 1, damps the amount of said light in a range ofr≦0.88 or changes the phase characteristic of said light or changes thephase of said light while damping the amount of said light, fordetecting a thickness unevenness in a transparent resin layer of therecording medium provided nearest said objective lens; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system.

Still further, the present invention can provide an optical head unitcomprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system for detecting a thicknessunevenness in a transparent resin layer of the recording medium providednearest said objective lens, said thickness unevenness detecting systemhaving an optical system for detecting a change of a maximum position ofcenter intensity in the optical axis direction while the defocuscorrection is being carried out based on the defocus detected by saiddefocus detecting system; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

said optical head unit corrects a defocus of said objective lens usingthe defocus detection signal detected by said defocus detecting systemand upon correcting the defocus, detects a thickness unevenness of saidtransparent resin layer by referring to a thickness unevenness detectionsignal detected from said optical system of said thickness unevennessdetecting system.

Further another, the present invention can provide an optical head unitcomprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system, includes an optical devicewhich, when the radius of a spot section of light which is a detectionobject is assumed to be 1, damps the amount of said light in a range ofr≦0.88 or changes the phase characteristic of said light or changes thephase of said light while damping the amount of said light, fordetecting a thickness unevenness in a transparent resin layer of therecording medium provided nearest said objective lens, said thicknessunevenness detecting system having an optical system for detecting achange of a maximum position of center intensity in the optical axisdirection while the defocus correction is being carried out based on thedefocus detected by said defocus detecting system; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

said optical head unit corrects a defocus of said objective lens usingthe defocus detection signal detected by said defocus detecting systemand upon correcting the defocus, detects a thickness unevenness of saidtransparent resin layer by referring to a thickness unevenness detectionsignal detected from said optical system of said thickness unevennessdetecting system.

Still further, the present invention can provide an optical head unitcomprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system detects a thickness unevennessof said transparent protective layer in said recording medium bydetecting a change of the maximum position of center intensity in theoptical axis direction while the defocus correction is being carried outbased on the defocus detected by said defocus detecting system; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

said optical head unit corrects a defocus of said objective lens usingthe defocus detection signal detected by said defocus detecting systemand upon correcting the defocus, detects a thickness unevenness of saidtransparent resin layer by referring to a thickness unevenness detectionsignal detected from said optical system of said thickness unevennessdetecting system.

Further another, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer or recording the information in said recordingmedium, said information recording/reproducing apparatus including anoptical head unit comprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system for detecting a thicknessunevenness in a transparent resin layer of the recording medium providednearest said objective lens; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

the thickness unevenness of said transparent resin layer is detectedusing a defocus detecting signal detected by said defocus detectingsystem so as to remove an influence of the defocus of said objectivelens by removing an influence of the thickness unevenness of thetransparent resin layer.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer or recording the information in said recordingmedium, said information recording/reproducing apparatus including anoptical head unit comprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system, includes an optical devicewhich, when the radius of a spot section of light which is a detectionobject is assumed to be 1, damps the amount of said light in a range ofr≦0.88 or changes the phase characteristic of said light or changes thephase of said light while damping the amount of said light, fordetecting a thickness unevenness in a transparent resin layer of therecording medium provided nearest said objective lens; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

the thickness unevenness of said transparent resin layer is detectedusing a defocus detecting signal detected by said defocus detectingsystem so as to remove an influence of the defocus of said objectivelens by removing an influence of the thickness unevenness of thetransparent resin layer.

Further another, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer or recording the information in said recordingmedium, said information recording/reproducing apparatus including anoptical head unit comprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system detects a thickness unevennessof said transparent protective layer of said recording medium bydetecting a change in which the center intensity in the optical axisdirection is maximized while the defocus correction is being carried outby referring to the amount of the defocus detected by said defocusdetecting system; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

the thickness unevenness of said transparent resin layer is detectedusing a defocus detecting signal detected by said defocus detectingsystem so as to remove an influence of the defocus of said objectivelens by removing an influence of the thickness unevenness of thetransparent resin layer.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer or recording the information in said recordingmedium, said information recording/reproducing apparatus including anoptical head unit comprising:

an objective lens for focusing light from the light source to arecording layer of the recording medium;

an objective lens moving mechanism for moving the objective lens in theoptical axis direction and in the direction intersecting a guide grooveand a signal mark string formed in said recording medium preliminarily;

a defocus detecting system for detecting a defocus in said objectivelens;

a thickness unevenness detecting system, includes an optical devicewhich, when the radius of a spot section of light which is a detectionobject is assumed to be 1, damps the amount of said light in a range ofr≦0.88 or changes the phase characteristic of said light or changes thephase of said light while damping the amount of said light, fordetecting a thickness unevenness in a transparent resin layer of therecording medium provided nearest said objective lens;

a defocus correcting mechanism for correcting the defocus of saidobjective lens by using a defocus detecting signal; wherein

said defocus correcting mechanism corrects the defocus of said objectivelens using the defocus detecting signal detected by said defocusdetecting system and detects a thickness unevenness of the transparentresin layer using said thickness unevenness detecting signal detected bysaid thickness unevenness detecting system upon correcting the defocusso as to remove an influence of the defocus of said objective lens byremoving an influence of the thickness unevenness of the transparentresin layer; and

a thickness unevenness correcting mechanism for changing the focusingcharacteristic of light impinging upon said objective lens from saidlight source based on a change in the thickness of said transparentresin layer of said recording medium detected by said thicknessdetecting system, wherein

the thickness unevenness of said transparent resin layer is detectedusing a defocus detecting signal detected by said defocus detectingsystem so as to remove an influence of the defocus of said objectivelens by removing an influence of the thickness unevenness of thetransparent resin layer.

Further another, the present invention can provide a method forcompensating for an influence of thickness unevenness in a recordingmedium upon reproducing information recorded in the recording layer ofthe recording medium or recording information in said recording medium,including an optical head comprising: an objective lens for focusinglight from a light source to a recording layer of a recording medium; adefocus detecting system for detecting a defocus generated when lightconverged to the recording medium by said objective lens is not focusedat a predetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

moving said objective lens in a predetermined direction while a voltagewhose magnitude changes gradually is applied to said thicknessunevenness correcting mechanism, with said defocus correcting systemturned off;

detecting that said objective lens is located in the vicinity of afocusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

activating said defocus correcting system when the sum level of saiddefocus detecting signal reaches a reference voltage;

moving said thickness unevenness correcting mechanism in the directionof decreasing the thickness unevenness correction amount detected bysaid thickness unevenness detecting system with respect to the recordinglayer on which light converged by said objective lens is focused; and

activating said thickness unevenness correcting mechanism when thethickness unevenness detecting signal outputted by said thicknessunevenness detecting system is substantially a reference voltage.

Still further, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

when changing the recording layer which light is focused by saidobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by said objective lens.

Further another, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system, said method comprising:

when changing the recording layer which light is focused by saidobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by said objective lens.

Still further, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system, said method comprising:

a level change in said thickness unevenness detecting signal is used soas to detect said objective lens erroneous move.

Further another, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system, said method comprising:

said thickness unevenness detecting mechanism is capable of generatingat least two independent detecting signals and detecting said objectivelens erroneous move by referring to a sum of the detecting signalsoutputted therefrom.

Still further, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system, said method comprising:

said thickness unevenness detecting mechanism is capable of generatingat least two independent detecting signals and detecting said objectivelens erroneous move by referring to a sum of the detecting signalsoutputted therefrom.

Further another, the present invention can provide a method for removingan influence of thickness unevenness in a recording medium uponreproducing information recorded in the recording layer of the recordingmedium or recording information in said recording medium, including anoptical head comprising: a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system, said method comprising:

moving said objective lens in a predetermined direction while a voltagewhose magnitude changes gradually is applied to said thicknessunevenness correcting mechanism, with said defocus correcting systemturned off;

detecting that said objective lens is located in the vicinity of afocusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

activating said defocus correcting system when said defocus detectingsignal outputted from said defocus detecting system reaches a referencevoltage;

moving said thickness unevenness correcting mechanism in the directionof decreasing the thickness unevenness correction amount detected bysaid thickness unevenness detecting system with respect to the recordinglayer on which said objective lens is focused;

activating said thickness unevenness correcting mechanism when thethickness unevenness detecting signal outputted by said thicknessunevenness detecting system is substantially a reference voltage; and

detecting the objective lens erroneous move that said objective lens ismoved so as to focus light from a currently focused recording layer toanother recording layer upon correcting said defocus.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer of a recording medium or recording information insaid recording medium, comprising:

an optical head including an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system;

moving section moves said objective lens in a predetermined directionwhile a voltage whose magnitude changes gradually is applied to saidthickness unevenness correcting mechanism, with said defocus correctingsystem turned off;

detecting section detects said objective lens is located in the vicinityof a focusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

first activating section controls said defocus correcting system whenthe sum level of said defocus detecting signals reaches a referencevoltage;

moving control section controls said thickness unevenness correctingmechanism in the direction of decreasing the thickness unevennesscorrection amount detected by said thickness unevenness detecting systemwith respect to the recording layer on which said objective lens isfocused; and

second activating section controls said thickness unevenness correctingmechanism when the thickness unevenness detecting signal outputted bysaid thickness unevenness detecting system is substantially a referencevoltage.

Further another, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded ina recording layer of the recording medium and recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system;

moving section moves said objective lens in a predetermined directionwhile a voltage whose magnitude changes gradually is applied to saidthickness unevenness correcting mechanism, with said defocus correctingsystem turned off;

detecting section detects said objective lens is located in the vicinityof a focusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

first activating section controls said defocus correcting system whenthe sum level of said defocus detecting signals reaches a referencevoltage;

moving control section controls said thickness unevenness correctingmechanism in the direction of decreasing the thickness unevennesscorrection amount detected by said thickness unevenness detecting systemwith respect to the recording layer on which said objective lens isfocused; and

second activating section controls said thickness unevenness correctingmechanism when the thickness unevenness detecting signal outputted bysaid thickness unevenness detecting system is substantially a referencevoltage;

when changing the recording layer which light is focused by saidobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by said objective lens.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded ina recording layer of the recording medium and recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system;

moving section moves said objective lens in a predetermined directionwhile a voltage whose magnitude changes gradually is applied to saidthickness unevenness correcting mechanism, with said defocus correctingsystem turned off;

detecting section detects said objective lens is located in the vicinityof a focusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

first activating section controls said defocus correcting system whenthe sum level of said defocus detecting signals reaches a referencevoltage;

moving control section controls said thickness unevenness correctingmechanism in the direction of decreasing the thickness unevennesscorrection amount detected by said thickness unevenness detecting systemwith respect to the recording layer on which said objective lens isfocused; and

second activating section controls said thickness unevenness correctingmechanism when the thickness unevenness detecting signal outputted bysaid thickness unevenness detecting system is substantially a referencevoltage;

when changing the recording layer which light is focused by saidobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by said objective lens.

Further another, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded ina recording layer of the recording medium and recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system;

moving section moves said objective lens in a predetermined directionwhile a voltage whose magnitude changes gradually is applied to saidthickness unevenness correcting mechanism, with said defocus correctingsystem turned off;

detecting section detects said objective lens is located in the vicinityof a focusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

first activating section controls said defocus correcting system whenthe sum level of said defocus detecting signals reaches a referencevoltage;

moving control section controls said thickness unevenness correctingmechanism in the direction of decreasing the thickness unevennesscorrection amount detected by said thickness unevenness detecting systemwith respect to the recording layer on which said objective lens isfocused; and

second activating section controls said thickness unevenness correctingmechanism when the thickness unevenness detecting signal outputted bysaid thickness unevenness detecting system is substantially a referencevoltage;

when changing the recording layer which light is focused by saidobjective lens from a currently focused recording layer to anotherrecording layer, terminating changing of the focusing characteristic oflight by the thickness unevenness correcting mechanism, terminatingdefocus correction control by the defocus correcting mechanism, andmoving a light converging position by said objective lens and using alevel change in said thickness unevenness detecting signal to detectsaid objective lens erroneous move.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded ina recording layer of the recording medium and recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system;

moving section moves said objective lens in a predetermined directionwhile a voltage whose magnitude changes gradually is applied to saidthickness unevenness correcting mechanism, with said defocus correctingsystem turned off;

detecting section detects said objective lens is located in the vicinityof a focusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

first activating section controls said defocus correcting system whenthe sum level of said defocus detecting signals reaches a referencevoltage;

moving control section controls said thickness unevenness correctingmechanism in the direction of decreasing the thickness unevennesscorrection amount detected by said thickness unevenness detecting systemwith respect to the recording layer on which said objective lens isfocused; and

second activating section controls said thickness unevenness correctingmechanism when the thickness unevenness detecting signal outputted bysaid thickness unevenness detecting system is substantially a referencevoltage;

wherein said thickness unevenness detecting mechanism is capable ofgenerating at least two independent detecting signals and detecting saidobjective lens erroneous move by referring to a sum of the detectingsignals outputted therefrom.

Further another, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded ina recording layer of the recording medium and recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position, and for detecting an objective lens erroneousmove that said objective lens is moved so as to focus light from arecording layer on which light converged by said objective lens iscurrently focused to another recording layer by using the thicknessunevenness detecting signal outputted from the thickness unevennessdetecting system; a thickness unevenness detecting system including atleast two photo detecting regions and for detecting a thicknessunevenness (spherical aberration) in a transparent resin layer of therecording medium provided nearest said objective lens; a thicknessunevenness correcting mechanism for changing focusing characteristic oflight impinging upon said objective lens from a light source based on achange in thickness of the transparent resin layer of the recordingmedium detected by the thickness unevenness detecting system; and adefocus correcting mechanism for correcting a defocus detected by saiddefocus detecting system;

wherein said thickness unevenness detecting mechanism is capable ofgenerating at least two independent detecting signals and detecting saidobjective lens erroneous move by referring to a sum of the detectingsignals outputted therefrom.

Still further, the present invention can provide an informationrecording/reproducing apparatus for reproducing information recorded inthe recording layer of a recording medium or recording information insaid recording medium, comprising:

an optical head including a light source for supplying light of apredetermined wavelength; an objective lens for focusing light from alight source to a recording layer of a recording medium; a defocusdetecting system for detecting a defocus generated when light convergedto the recording medium by said objective lens is not focused at apredetermined position; a thickness unevenness detecting systemincluding at least two photo detecting regions and for detecting athickness unevenness (spherical aberration) in a transparent resin layerof the recording medium provided nearest said objective lens; athickness unevenness correcting mechanism for changing focusingcharacteristic of light impinging upon said objective lens from a lightsource based on a change in thickness of the transparent resin layer ofthe recording medium detected by the thickness unevenness detectingsystem; and a defocus correcting mechanism for correcting a defocusdetected by said defocus detecting system;

moving said objective lens in a predetermined direction while a voltagewhose magnitude changes gradually is applied to said thicknessunevenness correcting mechanism, with said defocus correcting systemturned off;

detecting that said objective lens is located in the vicinity of afocusing position by referring to the level of a sum signal of thedefocus detecting signal outputted form individual photo detectingregions of said defocus detecting system;

activating said defocus correcting system when the sum level of saiddefocus detecting signals reaches a reference voltage;

moving said thickness unevenness correcting mechanism in the directionof decreasing the thickness unevenness correction amount detected bysaid thickness unevenness detecting system with respect to the recordinglayer on which said objective lens is focused; and

activating said thickness unevenness correcting mechanism when thethickness unevenness detecting signal outputted by said thicknessunevenness detecting system is substantially a reference voltage;wherein

said optical head corrects a defocus of said objective lens using thedefocus detection signal detected by said defocus detecting system andupon correcting the defocus, detects a thickness unevenness of saidtransparent resin layer by referring to a thickness unevenness detectionsignal detected from said optical system of said thickness unevennessdetecting system.

Additional advantages and modifications will readily occur to thoseskilled in the art. Therefore, the invention in its broader aspects isnot limited to the specific details and representative embodiments shownand described herein. Accordingly, various modifications may be madewithout departing from the spirit or scope of the general inventiveconcept as defined by the appended claims and their equivalents.

1. An optical head unit comprising: a light source supplies light of apredetermined wavelength; an objective lens focus the light from saidlight source to the recording layer of the recording medium; anobjective lens moving mechanism moves the objective lens in the opticalaxis direction and in the direction intersecting a guide groove and asignal mark string formed in said recording medium preliminarily; adefocus detecting system detects a defocus in said objective lens; athickness unevenness detecting system detects a thickness unevenness ina transparent resin layer of the recording medium provided nearest saidobjective lens; and a thickness unevenness correcting mechanism changesa focusing characteristic of light impinging upon said objective lensfrom said light source based on a change in the thickness of saidtransparent resin layer of said recording medium detected by saidthickness detecting system.